| No. |
Part Name |
Description |
Manufacturer |
| 31 |
BD5251G-TR |
Voltage Detector with Adjustable Delay Time |
ROHM |
| 32 |
BD52E51G-M |
Voltage Detector with Adjustable Delay Time |
ROHM |
| 33 |
BD52E51G-MTR |
Voltage Detector with Adjustable Delay Time |
ROHM |
| 34 |
BD52E51G-TR |
Voltage Detector with Adjustable Delay Time |
ROHM |
| 35 |
BD5351G-TR |
Voltage Detector with Adjustable Delay Time |
ROHM |
| 36 |
BD53E51G-M |
Voltage Detector with Adjustable Delay Time |
ROHM |
| 37 |
BD53E51G-MTR |
Voltage Detector with Adjustable Delay Time |
ROHM |
| 38 |
BD53E51G-TR |
Voltage Detector with Adjustable Delay Time |
ROHM |
| 39 |
BU7251G-TR |
High Speedr Push-Pull Comparator |
ROHM |
| 40 |
BYW51G-200 |
HIGH EFFICIENCY FAST RECOVERY RECTIFIER DIODES |
SGS Thomson Microelectronics |
| 41 |
BYW51G-200 |
HIGH EFFICIENCY FAST RECOVERY RECTIFIER DIODES |
ST Microelectronics |
| 42 |
BYW51G-200-TR |
HIGH EFFICIENCY FAST RECOVERY RECTIFIER DIODES |
ST Microelectronics |
| 43 |
CY7C13451G-100BZXE |
4-Mbit (128 K � 36) Flow-Through Sync SRAM |
Cypress |
| 44 |
CY7C13451G-100BZXET |
4-Mbit (128 K � 36) Flow-Through Sync SRAM |
Cypress |
| 45 |
CY7C1351G-100AXC |
4-Mbit (128K x 36) Flow-through SRAM with NoBL(TM) Architecture |
Cypress |
| 46 |
CY7C1351G-100AXCT |
4-Mbit (128 K � 36) Flow-through SRAM with NoBL� Architecture |
Cypress |
| 47 |
CY7C1351G-133AXC |
4-Mbit (128 K � 36) Flow-through SRAM with NoBL� Architecture |
Cypress |
| 48 |
RB751G-40 |
SCHOTTKY BARRIER RECTIFIERS |
Micro Commercial Components |
| 49 |
RB751G-40 |
Schottky Barrier Diode |
ROHM |
| 50 |
RB751G-40FH |
Schottky Barrier Diode (corresponds to AEC-Q101) |
ROHM |
| 51 |
RB751G-40FHT2R |
Schottky Barrier Diode (corresponds to AEC-Q101) |
ROHM |
| 52 |
RB751G-40T2R |
Schottky Barrier Diode |
ROHM |
| 53 |
TCAN1051G-Q1 |
Automotive Fault Protected CAN Transceiver With Flexible Data-Rate 8-SOIC -55 to 125 |
Texas Instruments |
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