| No. |
Part Name |
Description |
Manufacturer |
| 31 |
SN74BCT8373A |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches |
Texas Instruments |
| 32 |
SN74BCT8373ADW |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches |
Texas Instruments |
| 33 |
SN74BCT8373ADWR |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches |
Texas Instruments |
| 34 |
SN74BCT8373ANT |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches |
Texas Instruments |
| 35 |
SN74BCT8373DW |
Scan Test Device With Octal D-Type Latches 24-SOIC 0 to 70 |
Texas Instruments |
| 36 |
SN74BCT8373DWR |
Scan Test Device With Octal D-Type Latches 24-SOIC 0 to 70 |
Texas Instruments |
| 37 |
SN74BCT8373NT |
Scan Test Device With Octal D-Type Latches 24-PDIP 0 to 70 |
Texas Instruments |
| 38 |
SN74BCT8374A |
Scan Test Device With Octal D-Type Edge-Triggered Flip-Flops |
Texas Instruments |
| 39 |
SN74BCT8374ADW |
Scan Test Device With Octal D-Type Edge-Triggered Flip-Flops |
Texas Instruments |
| 40 |
SN74BCT8374ADWR |
Scan Test Device With Octal D-Type Edge-Triggered Flip-Flops |
Texas Instruments |
| 41 |
SN74BCT8374ANT |
Scan Test Device With Octal D-Type Edge-Triggered Flip-Flops |
Texas Instruments |
| 42 |
SN74BCT899 |
9-Bit Latchable Transceivers With Parity Generator/Checker 28-SOIC 0 to 70 |
Texas Instruments |
| 43 |
SN74BCT899DW |
9-Bit Latchable Transceivers With Parity Generator/Checker 28-SOIC 0 to 70 |
Texas Instruments |
| 44 |
SN74BCT899DWR |
9-Bit Latchable Transceivers With Parity Generator/Checker 28-SOIC 0 to 70 |
Texas Instruments |
| 45 |
SNJ54BCT8240AFK |
Scan Test Devices With Octal Buffers |
Texas Instruments |
| 46 |
SNJ54BCT8240AJT |
Scan Test Devices With Octal Buffers |
Texas Instruments |
| 47 |
SNJ54BCT8244AFK |
Scan Test Devices With Octal Buffers |
Texas Instruments |
| 48 |
SNJ54BCT8244AJT |
Scan Test Devices With Octal Buffers |
Texas Instruments |
| 49 |
SNJ54BCT8245AFK |
Scan Test Devices With Octal Bus Transceivers |
Texas Instruments |
| 50 |
SNJ54BCT8245AJT |
Scan Test Devices With Octal Bus Transceivers |
Texas Instruments |
| 51 |
SNJ54BCT8373AFK |
Scan Test Devices With Octal D-type Latches |
Texas Instruments |
| 52 |
SNJ54BCT8373AJT |
Scan Test Devices With Octal D-type Latches |
Texas Instruments |
| 53 |
SNJ54BCT8374AFK |
Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops |
Texas Instruments |
| 54 |
SNJ54BCT8374AJT |
Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops |
Texas Instruments |
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