No. |
Part Name |
Description |
Manufacturer |
31 |
A67L8316E-4.2 |
Cycle time:7ns; access time:4.2ns; 256K x 16 LVTTL, pipelined DBA SRAM |
AMIC Technology |
32 |
A67L8316E-4.5 |
Cycle time:8.5ns;accesstime:4.5ns 256K x 16 LVTTL, pipelined DBA SRAM |
AMIC Technology |
33 |
A67L8316E-4.5 |
Cycle time:7ns; access time:4.5ns; 256K x 16 LVTTL, pipelined DBA SRAM |
AMIC Technology |
34 |
A67L8316E-45 |
256K X 16/18/ 128K X 32/36 LVTTL/ Pipelined DBA SRAM |
AMIC Technology |
35 |
A67L8318E-4 |
Cycle time:7ns; access time:4ns; 256K x 16 LVTTL, pipelined DBA SRAM |
AMIC Technology |
36 |
A67L8318E-4.2 |
Cycle time:7ns; access time:4.2ns; 256K x 16 LVTTL, pipelined DBA SRAM |
AMIC Technology |
37 |
A67L8318E-4.5 |
Cycle time:7ns; access time:4.5ns; 256K x 16 LVTTL, pipelined DBA SRAM |
AMIC Technology |
38 |
A67L8318E-4.5 |
Cycle time:8.50ns;accesstime:4.5ns 256K x 18 LVTTL, pipelined DBA SRAM |
AMIC Technology |
39 |
A67L8318E-45 |
256K X 16/18/ 128K X 32/36 LVTTL/ Pipelined DBA SRAM |
AMIC Technology |
40 |
AS91L1001E-40L100-CF |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
41 |
AS91L1001E-40L100-CG |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
42 |
AS91L1001E-40L100-I |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
43 |
AS91L1001E-40L100-IF |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
44 |
AS91L1001E-40L100-IG |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
45 |
AS91L1002E-40L100-CF |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
46 |
AS91L1002E-40L100-CG |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
47 |
AS91L1002E-40L100-I |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
48 |
AS91L1002E-40L100-IF |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
49 |
AS91L1002E-40L100-IG |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
50 |
AS91L1003E-40L100-CF |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
51 |
AS91L1003E-40L100-CG |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
52 |
AS91L1003E-40L100-I |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
53 |
AS91L1003E-40L100-IF |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
54 |
AS91L1003E-40L100-IG |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
55 |
AS91L1006E-40L100-CF |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
56 |
AS91L1006E-40L100-CG |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
57 |
AS91L1006E-40L100-I |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
58 |
AS91L1006E-40L100-IF |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
59 |
AS91L1006E-40L100-IG |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
60 |
CBE-44 |
Mounting hardware |
SESCOSEM |
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