| No. |
Part Name |
Description |
Manufacturer |
| 31 |
SN74BCT8373 |
Scan Test Device With Octal D-Type Latches 24-PDIP 0 to 70 |
Texas Instruments |
| 32 |
SN74BCT8373DW |
Scan Test Device With Octal D-Type Latches 24-SOIC 0 to 70 |
Texas Instruments |
| 33 |
SN74BCT8373DWR |
Scan Test Device With Octal D-Type Latches 24-SOIC 0 to 70 |
Texas Instruments |
| 34 |
SN74BCT8373NT |
Scan Test Device With Octal D-Type Latches 24-PDIP 0 to 70 |
Texas Instruments |
| 35 |
SN74CBT3383DWRG4 |
10-Bit FET Bus-Exchange Switches 24-SOIC -40 to 85 |
Texas Instruments |
| 36 |
SN74CBT3383PWRG4 |
10-Bit FET Bus-Exchange Switches 24-TSSOP -40 to 85 |
Texas Instruments |
| 37 |
SN74HC4514DW |
4-Line To 16-Line Decoders/Demultiplexers With Address Latches 24-SOIC -40 to 85 |
Texas Instruments |
| 38 |
SN74HC4514NT |
4-Line To 16-Line Decoders/Demultiplexers With Address Latches 24-PDIP -40 to 85 |
Texas Instruments |
| 39 |
SN74LVT8980ADWRG4 |
Embedded Test-Bus Controllers IEEE STD 1149.1 (JTAG) TAP Masters W/ 8-Bit Generic Host Interfaces 24-SOIC -40 to 85 |
Texas Instruments |
| 40 |
TPS65280RGER |
5.5V to 18V input, fixed 5V output, 4A synchronous buck converter with dual load switches 24-VQFN -40 to 85 |
Texas Instruments |
| 41 |
TPS65282RGER |
4.5V to 18V input, 4A output synchronous buck converter with dual power distribution switches 24-VQFN -40 to 125 |
Texas Instruments |
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