No. |
Part Name |
Description |
Manufacturer |
31 |
EDI88512CAF32M |
512Kx8 Monolithic SRAM, SMD 5962-95600 |
White Electronic Designs |
32 |
EDI88512LPA15F32M |
15ns; 5V power supply; 512K x 8 monolithic SRAM, SMD 5962-95600 |
White Electronic Designs |
33 |
EDI88512LPA17F32M |
17ns; 5V power supply; 512K x 8 monolithic SRAM, SMD 5962-95600 |
White Electronic Designs |
34 |
EDI88512LPA20F32M |
20ns; 5V power supply; 512K x 8 monolithic SRAM, SMD 5962-95600 |
White Electronic Designs |
35 |
EDI88512LPA25F32M |
25ns; 5V power supply; 512K x 8 monolithic SRAM, SMD 5962-95600 |
White Electronic Designs |
36 |
EDI88512LPA35F32M |
35ns; 5V power supply; 512K x 8 monolithic SRAM, SMD 5962-95600 |
White Electronic Designs |
37 |
EDI88512LPA45F32M |
45ns; 5V power supply; 512K x 8 monolithic SRAM, SMD 5962-95600 |
White Electronic Designs |
38 |
EDI88512LPA55F32M |
55ns; 5V power supply; 512K x 8 monolithic SRAM, SMD 5962-95600 |
White Electronic Designs |
39 |
EDI88512LPAF32M |
512Kx8 Monolithic SRAM, SMD 5962-95600 |
White Electronic Designs |
40 |
ERJL12UF32MU |
Current Sensing Chip Resistors Thick Film Type |
Panasonic |
41 |
ERJL14UF32MU |
Current Sensing Chip Resistors Thick Film Type |
Panasonic |
42 |
MF32M1-J8CATXX |
8/16-bit Data Bus Static RAM Card |
Mitsubishi Electric Corporation |
43 |
MF32M1-J9CATXX |
8/16-bit Data Bus Static RAM Card |
Mitsubishi Electric Corporation |
44 |
MF32M1-LCDATXX |
8/16-bit Data Bus Static RAM Card |
Mitsubishi Electric Corporation |
45 |
MF32M1-LSDATXX |
8/16-bit Data Bus Static RAM Card |
Mitsubishi Electric Corporation |
46 |
MF32M1-LYCATXX |
8/16-bit Data Bus Static RAM Card |
Mitsubishi Electric Corporation |
47 |
MF32M1-LZCATXX |
8/16-bit Data Bus Static RAM Card |
Mitsubishi Electric Corporation |
48 |
MN103LF32M |
MN103L Series embedded Panasonic core |
Panasonic |
49 |
MNDS26F32M-X-RH |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
50 |
MNDS26F32ME/883 |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
51 |
MNDS26F32MER-QML |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
52 |
MNDS26F32MJ-QMLV |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
53 |
MNDS26F32MJ/883 |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
54 |
MNDS26F32MJR-QML |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
55 |
MNDS26F32MJRQMLV |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
56 |
MNDS26F32MW-QMLV |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
57 |
MNDS26F32MW/883 |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
58 |
MNDS26F32MWG/883 |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
59 |
MNDS26F32MWGRQMLV |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
60 |
MNDS26F32MWR-QML |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
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