No. |
Part Name |
Description |
Manufacturer |
31 |
SCAN921226HSM/NOPB |
High Temperature 20MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 125 |
Texas Instruments |
32 |
SCAN921226HSMX |
High Temperature 20MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access |
National Semiconductor |
33 |
SCAN921226SLC |
30MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access |
National Semiconductor |
34 |
SCAN921226SLC/NOPB |
30-80 MHz 10 Bit Bus LVDS Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST 49-NFBGA |
Texas Instruments |
35 |
SCAN921226SLCX |
30MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access |
National Semiconductor |
36 |
SCAN921260 |
X6 1:10 Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST |
National Semiconductor |
37 |
SCAN921260 |
six 1 to 10 deserializers with IEEE 1149.1 and at-speed BIST |
Texas Instruments |
38 |
SCAN921260UJB |
six 1 to 10 deserializers with IEEE 1149.1 and at-speed BIST |
National Semiconductor |
39 |
SCAN921260UJB/NOPB |
six 1 to 10 deserializers with IEEE 1149.1 and at-speed BIST 196-NFBGA -40 to 85 |
Texas Instruments |
40 |
SCAN921260UJBX |
six 1 to 10 deserializers with IEEE 1149.1 and at-speed BIST |
National Semiconductor |
41 |
SCAN921821 |
Dual 18-Bit Serializer with Pre-Emphasis, IEEE 1149.1 (JTAG), and At-Speed BIST |
National Semiconductor |
42 |
SCAN921821 |
Dual 18-Bit Serializer with Pre-Emphasis, IEEE 1149.1 (JTAG), and At-Speed BIST |
Texas Instruments |
43 |
SCAN921821EVK |
Dual 18-Bit Serializer with Pre-Emphasis, IEEE 1149.1 (JTAG), and At-Speed BIST |
National Semiconductor |
44 |
SCAN921821SM |
3.3 V, dual 18-bit serializer with pre-emphasis, IEEE 1149.1 (JTAG) and at-speed BIST |
National Semiconductor |
45 |
SCAN921821TSM |
Dual 18-Bit Serializer with Pre-Emphasis, IEEE 1149.1 (JTAG), and At-Speed BIST |
National Semiconductor |
46 |
SCAN921821TSM/NOPB |
Dual 18-Bit Serializer with Pre-Emphasis, IEEE 1149.1 (JTAG), and At-Speed BIST 100-NFBGA -40 to 85 |
Texas Instruments |
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