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Datasheets for TEST A

Datasheets found :: 75
Page: | 1 | 2 | 3 |
No. Part Name Description Manufacturer
31 MAX678AEJP 889mW; V(cc): -0.3 to +20V; calibrated, low-drift, +4.096V / +5V / +10V precision voltage reference. For high resolution 16-bit ADCs and DACs, precision test and measurement systems, precision calibrated voltage-reference, high-accuracy tr MAXIM - Dallas Semiconductor
32 MAX678AEPP 889mW; V(cc): -0.3 to +20V; calibrated, low-drift, +4.096V / +5V / +10V precision voltage reference. For high resolution 16-bit ADCs and DACs, precision test and measurement systems, precision calibrated voltage-reference, high-accuracy tr MAXIM - Dallas Semiconductor
33 MAX678AEWP 800mW; V(cc): -0.3 to +20V; calibrated, low-drift, +4.096V / +5V / +10V precision voltage reference. For high resolution 16-bit ADCs and DACs, precision test and measurement systems, precision calibrated voltage-reference, high-accuracy tr MAXIM - Dallas Semiconductor
34 MAX678AMJP 889mW; V(cc): -0.3 to +20V; calibrated, low-drift, +4.096V / +5V / +10V precision voltage reference. For high resolution 16-bit ADCs and DACs, precision test and measurement systems, precision calibrated voltage-reference, high-accuracy tr MAXIM - Dallas Semiconductor
35 MAX678BCPP 889mW; V(cc): -0.3 to +20V; calibrated, low-drift, +4.096V / +5V / +10V precision voltage reference. For high resolution 16-bit ADCs and DACs, precision test and measurement systems, precision calibrated voltage-reference, high-accuracy tr MAXIM - Dallas Semiconductor
36 MAX678BCWP 800mW; V(cc): -0.3 to +20V; calibrated, low-drift, +4.096V / +5V / +10V precision voltage reference. For high resolution 16-bit ADCs and DACs, precision test and measurement systems, precision calibrated voltage-reference, high-accuracy tr MAXIM - Dallas Semiconductor
37 MAX678BEPP 889mW; V(cc): -0.3 to +20V; calibrated, low-drift, +4.096V / +5V / +10V precision voltage reference. For high resolution 16-bit ADCs and DACs, precision test and measurement systems, precision calibrated voltage-reference, high-accuracy tr MAXIM - Dallas Semiconductor
38 MAX678BEWP 800mW; V(cc): -0.3 to +20V; calibrated, low-drift, +4.096V / +5V / +10V precision voltage reference. For high resolution 16-bit ADCs and DACs, precision test and measurement systems, precision calibrated voltage-reference, high-accuracy tr MAXIM - Dallas Semiconductor
39 MAX678BMJP 889mW; V(cc): -0.3 to +20V; calibrated, low-drift, +4.096V / +5V / +10V precision voltage reference. For high resolution 16-bit ADCs and DACs, precision test and measurement systems, precision calibrated voltage-reference, high-accuracy tr MAXIM - Dallas Semiconductor
40 NCS37010 Ground Fault Circuit Interrupter (GFCI) with Self Test and Lockout ON Semiconductor
41 SCAN921023 20 MHz-66MHz 10-Bit Serializer with IEEE 1149.1 Test Access Texas Instruments
42 SCAN921023SLC 20 MHz-66MHz 10-Bit Serializer with IEEE 1149.1 Test Access National Semiconductor
43 SCAN921023SLC 20 MHz-66MHz 10-Bit Serializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 85 Texas Instruments
44 SCAN921023SLC/NOPB 20 MHz-66MHz 10-Bit Serializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 85 Texas Instruments
45 SCAN921023SLCX 20 MHz-66MHz 10-Bit Serializer with IEEE 1149.1 Test Access National Semiconductor
46 SCAN921025H High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access National Semiconductor
47 SCAN921025H High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access Texas Instruments
48 SCAN921025HSM High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access National Semiconductor
49 SCAN921025HSM High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 125 Texas Instruments
50 SCAN921025HSM/NOPB High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 125 Texas Instruments
51 SCAN921025HSMX High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access National Semiconductor
52 SCAN921025HSMX/NOPB High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 125 Texas Instruments
53 SCAN921025SLC 30MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access National Semiconductor
54 SCAN921025SLCX 30MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access National Semiconductor
55 SCAN921224 20 MHz-66MHz 10-Bit Deserializer with IEEE 1149.1 Test Access Texas Instruments
56 SCAN921224SLC 20 MHz-66MHz 10-Bit Deserializer with IEEE 1149.1 Test Access National Semiconductor
57 SCAN921224SLC 20 MHz-66MHz 10-Bit Deserializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 85 Texas Instruments
58 SCAN921224SLC/NOPB 20 MHz-66MHz 10-Bit Deserializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 85 Texas Instruments
59 SCAN921224SLCX 20 MHz-66MHz 10-Bit Deserializer with IEEE 1149.1 Test Access National Semiconductor
60 SCAN921226H High Temperature 20MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access National Semiconductor


Datasheets found :: 75
Page: | 1 | 2 | 3 |



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