| No. |
Part Name |
Description |
Manufacturer |
| 331 |
FAR-F6CE1G6190-K222 |
Piezoelectric SAW BPF (700 to 1700 MHz) |
Fujitsu Microelectronics |
| 332 |
FAR-F6CE1G6190-K222-U |
Piezoelectric SAW BPF (1000 to 2500 MHz) |
Fujitsu Microelectronics |
| 333 |
FAR-F6CE1G6190-K222-V |
Piezoelectric SAW BPF (1000 to 2500 MHz) |
Fujitsu Microelectronics |
| 334 |
FAR-F6CE1G6190-K222-W |
Piezoelectric SAW BPF (1000 to 2500 MHz) |
Fujitsu Microelectronics |
| 335 |
FAR-F6CP-1G4410-D207 |
Piezoelectric SAW BPF (700 to 1700MHz) |
Fujitsu Microelectronics |
| 336 |
FAR-F6CP-1G4410-D207-U |
Piezoelectric SAW BPF (700 to 1700MHz) |
Fujitsu Microelectronics |
| 337 |
FAR-F6CP-1G4410-D207-V |
Piezoelectric SAW BPF (700 to 1700MHz) |
Fujitsu Microelectronics |
| 338 |
FAR-F6CP-1G4410-D207-W |
Piezoelectric SAW BPF (700 to 1700MHz) |
Fujitsu Microelectronics |
| 339 |
FAR-F6CP-1G4890-D208 |
Piezoelectric SAW BPF (700 to 1700MHz) |
Fujitsu Microelectronics |
| 340 |
FAR-F6CP-1G4890-D208-U |
Piezoelectric SAW BPF (700 to 1700MHz) |
Fujitsu Microelectronics |
| 341 |
FAR-F6CP-1G4890-D208-V |
Piezoelectric SAW BPF (700 to 1700MHz) |
Fujitsu Microelectronics |
| 342 |
FAR-F6CP-1G4890-D208-W |
Piezoelectric SAW BPF (700 to 1700MHz) |
Fujitsu Microelectronics |
| 343 |
HA-5340_883 |
High Speed, Low Distortion, Precision Monolithic Sample and Hold Amplifier |
Intersil |
| 344 |
HA1-5340883 |
High Speed/ Low Distortion/ Precision Monolithic Sample and Hold Amplifier |
Intersil |
| 345 |
HA4-5340883 |
High Speed/ Low Distortion/ Precision Monolithic Sample and Hold Amplifier |
Intersil |
| 346 |
HA5340 |
High Speed/ Low Distortion/ Precision Monolithic Sample and Hold Amplifier |
Intersil |
| 347 |
HA5340883 |
High Speed/ Low Distortion/ Precision Monolithic Sample and Hold Amplifier |
Intersil |
| 348 |
JL198BGA |
Monolithic Sample and Hold Circuit 8-TO-99 -55 to 125 |
Texas Instruments |
| 349 |
JL198BGA-MPR |
Monolithic Sample and Hold Circuit |
National Semiconductor |
| 350 |
JL198SGA |
Monolithic Sample and Hold Circuit 8-TO-99 -55 to 125 |
Texas Instruments |
| 351 |
JM38510/12501BGA |
Monolithic Sample and Hold Circuit |
National Semiconductor |
| 352 |
JM38510/12501BGA |
Monolithic Sample and Hold Circuit |
National Semiconductor |
| 353 |
JM38510/12501BGA |
Monolithic Sample and Hold Circuit |
National Semiconductor |
| 354 |
JM38510/12501BGA |
Monolithic Sample and Hold Circuit 8-TO-99 -55 to 125 |
Texas Instruments |
| 355 |
JM38510/12501SGA |
Monolithic Sample and Hold Circuit |
National Semiconductor |
| 356 |
JM38510/12501SGA |
Monolithic Sample and Hold Circuit |
National Semiconductor |
| 357 |
JM38510/12501SGA |
Monolithic Sample and Hold Circuit |
National Semiconductor |
| 358 |
JM38510/12501SGA |
Monolithic Sample and Hold Circuit 8-TO-99 -55 to 125 |
Texas Instruments |
| 359 |
JM38510_12501BG |
Monolithic Sample and Hold Circuit |
National Semiconductor |
| 360 |
JM38510_12501SG |
Monolithic Sample and Hold Circuit |
National Semiconductor |
| | | |
