| No. |
Part Name |
Description |
Manufacturer |
| 3511 |
GFC5440-DC |
Dual four input NAND power gates |
SESCOSEM |
| 3512 |
GFC5440-DP |
Dual four input NAND power gates |
SESCOSEM |
| 3513 |
GFC5440-FM |
Dual four input NAND power gates |
SESCOSEM |
| 3514 |
GJH101/74H30N |
Single 8-input NAND gate |
Mullard |
| 3515 |
GJH111/74H20N |
Dual 4-input NAND gate |
Mullard |
| 3516 |
GJH121/74H10N |
Triple 3-input NAND gate |
Mullard |
| 3517 |
GJH131/74H00N |
Quadruple 2-input NAND gate |
Mullard |
| 3518 |
GJH141/74H40N |
Dual 4-input NAND buffer gate |
Mullard |
| 3519 |
GJH231/74H01N |
Quadruple 2-input positive NAND gate with wired-OR capability |
Mullard |
| 3520 |
GTH111/74S20 |
Dual 4-input NAND gate |
Mullard |
| 3521 |
H102 |
Quad 2-input NAND |
SGS-ATES |
| 3522 |
H102 |
Quad 2-input NAND gate (active pull-up), standard temperature range |
SGS-ATES |
| 3523 |
H102 |
Quad 2-input NAND gate (active pull-up), intermediate temperature range |
SGS-ATES |
| 3524 |
H102 |
Quad 2-input NAND gate (active pull-up), extended temperature range |
SGS-ATES |
| 3525 |
H103 |
Triple 3-input NAND |
SGS-ATES |
| 3526 |
H103 |
Triple 3-input NAND gate (active pull-up), standard temperature range |
SGS-ATES |
| 3527 |
H103 |
Triple 3-input NAND gate (active pull-up), intermediate temperature range |
SGS-ATES |
| 3528 |
H103 |
Triple 3-input NAND gate (active pull-up), extended temperature range |
SGS-ATES |
| 3529 |
H104 |
Expandable dual 4-input NAND |
SGS-ATES |
| 3530 |
H104 |
Dual 4-input expandable NAND gate (active pull-up), standard temperature range |
SGS-ATES |
| 3531 |
H104 |
Dual 4-input expandable NAND gate (active pull-up), intermediate temperature range |
SGS-ATES |
| 3532 |
H104 |
Dual 4-input expandable NAND gate (active pull-up), extended temperature range |
SGS-ATES |
| 3533 |
H113 |
Dual 2-input NAND gate plus dual expandable inverter (open-collector), standard temperature range |
SGS-ATES |
| 3534 |
H113 |
Dual 2-input NAND gate plus dual expandable inverter (open-collector), intermediate temperature range |
SGS-ATES |
| 3535 |
H113 |
Dual 2-input NAND gate plus dual expandable inverter (open-collector), extended temperature range |
SGS-ATES |
| 3536 |
H122 |
Quad 2-input (passive pull-up) NAND |
SGS-ATES |
| 3537 |
H122 |
Quad 2-input NAND gate (passive pull-up), standard temperature range |
SGS-ATES |
| 3538 |
H122 |
Quad 2-input NAND gate (passive pull-up), intermediate temperature range |
SGS-ATES |
| 3539 |
H122 |
Quad 2-input NAND gate (passive pull-up), extended temperature range |
SGS-ATES |
| 3540 |
H124 |
Exp. dual 4-input (passive pull-up) NAND |
SGS-ATES |
| | | |
