| No. |
Part Name |
Description |
Manufacturer |
| 3571 |
5962-9051601M2A |
Octal Edge-Triggered D-type Flip-Flops With 3-State Outputs |
Texas Instruments |
| 3572 |
5962-9051601MRA |
Octal Edge-Triggered D-type Flip-Flops With 3-State Outputs |
Texas Instruments |
| 3573 |
5962-9051601MSA |
Octal Edge-Triggered D-type Flip-Flops With 3-State Outputs |
Texas Instruments |
| 3574 |
5962-9074601M2A |
Octal Transparent D-type Latches With 3-State Outputs |
Texas Instruments |
| 3575 |
5962-9074601MRA |
Octal Transparent D-type Latches With 3-State Outputs |
Texas Instruments |
| 3576 |
5962-9074601MSA |
Octal Transparent D-type Latches With 3-State Outputs |
Texas Instruments |
| 3577 |
5962-9074701MRA |
Octal Edge-Triggered D-type Flip-Flops With 3-State Outputs 20-CDIP -55 to 125 |
Texas Instruments |
| 3578 |
5962-9161101M3A |
8-Bit D-Type Flip-Flop |
National Semiconductor |
| 3579 |
5962-9161101M3A(54ACT825LMQB) |
8-Bit D-Type Flip-Flop |
National Semiconductor |
| 3580 |
5962-9161101M3A(54ACT825LMQB) |
8-Bit D-Type Flip-Flop |
National Semiconductor |
| 3581 |
5962-9161101MKA |
8-Bit D-Type Flip-Flop |
National Semiconductor |
| 3582 |
5962-9161101MKA(54ACT825FMQB) |
8-Bit D-Type Flip-Flop |
National Semiconductor |
| 3583 |
5962-9161101MKA(54ACT825FMQB) |
8-Bit D-Type Flip-Flop |
National Semiconductor |
| 3584 |
5962-9161101MLA |
8-Bit D-Type Flip-Flop |
National Semiconductor |
| 3585 |
5962-9161101MLA(54ACT825SDMQB) |
8-Bit D-Type Flip-Flop |
National Semiconductor |
| 3586 |
5962-9161101MLA(54ACT825SDMQB) |
8-Bit D-Type Flip-Flop |
National Semiconductor |
| 3587 |
5962-9172501M3A |
Scan Test Devices With Octal D-type Latches |
Texas Instruments |
| 3588 |
5962-9172501MLA |
Scan Test Devices With Octal D-type Latches |
Texas Instruments |
| 3589 |
5962-9172701Q3A |
Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops |
Texas Instruments |
| 3590 |
5962-9172701QLA |
Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops |
Texas Instruments |
| 3591 |
5962-9202401MXA |
16-BIT D-TYPE TRANSPARENT LATCHES WITH 3-STATE OUTPUTS |
Texas Instruments |
| 3592 |
5962-9202501MXA |
16-Bit D-type Edge-Triggered Flip-Flops With 3-State Outputs |
Texas Instruments |
| 3593 |
5962-9211803QXA |
Non-RadHard enhanced SuMMIT E MIL-STD-1553 dual redundant bus controller/remote terminal monitor: SMD. Device type 03. Class designator Q. Lead finish solder. Radiation none. |
Aeroflex Circuit Technology |
| 3594 |
5962-9211803QXC |
Non-RadHard enhanced SuMMIT E MIL-STD-1553 dual redundant bus controller/remote terminal monitor: SMD. Device type 03. Class designator Q. Lead finish gold. Radiation none. |
Aeroflex Circuit Technology |
| 3595 |
5962-9211803QXX |
Non-RadHard enhanced SuMMIT E MIL-STD-1553 dual redundant bus controller/remote terminal monitor: SMD. Device type 03. Class designator Q. Lead finish optional. Radiation none. |
Aeroflex Circuit Technology |
| 3596 |
5962-9211803QYA |
Non-RadHard enhanced SuMMIT E MIL-STD-1553 dual redundant bus controller/remote terminal monitor: SMD. Device type 03. Class designator Q. Lead finish solder. Radiation none. |
Aeroflex Circuit Technology |
| 3597 |
5962-9211803QYC |
Non-RadHard enhanced SuMMIT E MIL-STD-1553 dual redundant bus controller/remote terminal monitor: SMD. Device type 03. Class designator Q. Lead finish gold. Radiation none. |
Aeroflex Circuit Technology |
| 3598 |
5962-9211803QYX |
Non-RadHard enhanced SuMMIT E MIL-STD-1553 dual redundant bus controller/remote terminal monitor: SMD. Device type 03. Class designator Q. Lead finish optional. Radiation none. |
Aeroflex Circuit Technology |
| 3599 |
5962-9211803QZA |
Non-RadHard enhanced SuMMIT E MIL-STD-1553 dual redundant bus controller/remote terminal monitor: SMD. Device type 03. Class designator Q. Lead finish solder. Radiation none. |
Aeroflex Circuit Technology |
| 3600 |
5962-9211803QZC |
Non-RadHard enhanced SuMMIT E MIL-STD-1553 dual redundant bus controller/remote terminal monitor: SMD. Device type 03. Class designator Q. Lead finish gold. Radiation none. |
Aeroflex Circuit Technology |
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