| No. |
Part Name |
Description |
Manufacturer |
| 3781 |
KDZVTFTR30B |
Zener Diode (corresponds to AEC-Q101) |
ROHM |
| 3782 |
KDZVTFTR33B |
Zener Diode (corresponds to AEC-Q101) |
ROHM |
| 3783 |
KDZVTFTR36B |
Zener Diode (corresponds to AEC-Q101) |
ROHM |
| 3784 |
KDZVTFTR4.3B |
Zener Diode (corresponds to AEC-Q101) |
ROHM |
| 3785 |
KDZVTFTR4.7B |
Zener Diode (corresponds to AEC-Q101) |
ROHM |
| 3786 |
KDZVTFTR5.1B |
Zener Diode (corresponds to AEC-Q101) |
ROHM |
| 3787 |
KDZVTFTR5.6B |
Zener Diode (corresponds to AEC-Q101) |
ROHM |
| 3788 |
KDZVTFTR6.2B |
Zener Diode (corresponds to AEC-Q101) |
ROHM |
| 3789 |
KDZVTFTR6.8B |
Zener Diode (corresponds to AEC-Q101) |
ROHM |
| 3790 |
KDZVTFTR7.5B |
Zener Diode (corresponds to AEC-Q101) |
ROHM |
| 3791 |
KDZVTFTR8.2B |
Zener Diode (corresponds to AEC-Q101) |
ROHM |
| 3792 |
KDZVTFTR9.1B |
Zener Diode (corresponds to AEC-Q101) |
ROHM |
| 3793 |
LDC1000-Q1 |
5V, High Resolution, AECQ100, Inductance to Digital Converter for Inductive Sensing Applications 16-TSSOP -40 to 125 |
Texas Instruments |
| 3794 |
LDC1000EPWRQ1 |
5V, High Resolution, AECQ100, Inductance to Digital Converter for Inductive Sensing Applications 16-TSSOP -40 to 150 |
Texas Instruments |
| 3795 |
LDC1000QPWRQ1 |
5V, High Resolution, AECQ100, Inductance to Digital Converter for Inductive Sensing Applications 16-TSSOP -40 to 125 |
Texas Instruments |
| 3796 |
LDC1312-Q1 |
2-channel, AEC-Q100 qualified, 12-bit Inductance-to-Digital Converter with I2C for Inductive Sensing 12-WSON -40 to 125 |
Texas Instruments |
| 3797 |
LDC1312QDNTRQ1 |
2-channel, AEC-Q100 qualified, 12-bit Inductance-to-Digital Converter with I2C for Inductive Sensing 12-WSON -40 to 125 |
Texas Instruments |
| 3798 |
LDC1312QDNTTQ1 |
2-channel, AEC-Q100 qualified, 12-bit Inductance-to-Digital Converter with I2C for Inductive Sensing 12-WSON -40 to 125 |
Texas Instruments |
| 3799 |
LDC1314-Q1 |
4-channel, AEC-Q100 qualified, 12-bit Inductance-to-Digital Converter with I2C for Inductive Sensing 16-WQFN -40 to 125 |
Texas Instruments |
| 3800 |
LDC1314QRGHRQ1 |
4-channel, AEC-Q100 qualified, 12-bit Inductance-to-Digital Converter with I2C for Inductive Sensing 16-WQFN -40 to 125 |
Texas Instruments |
| 3801 |
LDC1314QRGHTQ1 |
4-channel, AEC-Q100 qualified, 12-bit Inductance-to-Digital Converter with I2C for Inductive Sensing 16-WQFN -40 to 125 |
Texas Instruments |
| 3802 |
LDC1612-Q1 |
2-channel, AEC-Q100 qualified, 28-bit Inductance-to-Digital Converter with I2C for Inductive Sensing 12-WSON -40 to 125 |
Texas Instruments |
| 3803 |
LDC1612QDNTRQ1 |
2-channel, AEC-Q100 qualified, 28-bit Inductance-to-Digital Converter with I2C for Inductive Sensing 12-WSON -40 to 125 |
Texas Instruments |
| 3804 |
LDC1612QDNTTQ1 |
2-channel, AEC-Q100 qualified, 28-bit Inductance-to-Digital Converter with I2C for Inductive Sensing 12-WSON -40 to 125 |
Texas Instruments |
| 3805 |
LDC1614-Q1 |
4-channel, AEC-Q100 qualified, 28-bit Inductance-to-Digital Converter with I2C for Inductive Sensing 16-WQFN -40 to 125 |
Texas Instruments |
| 3806 |
LDC1614QRGHRQ1 |
4-channel, AEC-Q100 qualified, 28-bit Inductance-to-Digital Converter with I2C for Inductive Sensing 16-WQFN -40 to 125 |
Texas Instruments |
| 3807 |
LDC1614QRGHTQ1 |
4-channel, AEC-Q100 qualified, 28-bit Inductance-to-Digital Converter with I2C for Inductive Sensing 16-WQFN -40 to 125 |
Texas Instruments |
| 3808 |
LH75401N0Q100C0 |
System-on-Chip |
NXP Semiconductors |
| 3809 |
LH75411N0Q100C0 |
System-on-Chip |
NXP Semiconductors |
| 3810 |
LH79525N0Q100A1 |
System-on-Chip |
NXP Semiconductors |
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