No. |
Part Name |
Description |
Manufacturer |
391 |
ASY57N |
PNP Germanium RF Alloy Transistor in TO1 metal case |
Newmarket Transistors NKT |
392 |
ASY58N |
PNP Germanium RF Alloy Transistor in TO1 metal case |
Newmarket Transistors NKT |
393 |
ASY59N |
PNP Germanium RF Alloy Transistor in TO1 metal case |
Newmarket Transistors NKT |
394 |
ASY63N |
PNP Germanium RF Alloy Transistor in TO1 metal case |
Newmarket Transistors NKT |
395 |
ASY76 |
PNP Germanium AF Alloy Transistor in TO5 metal case |
Newmarket Transistors NKT |
396 |
ASY77 |
PNP Germanium AF Alloy Transistor in TO5 metal case |
Newmarket Transistors NKT |
397 |
ASY80 |
PNP Germanium AF Alloy Transistor in TO5 metal case |
Newmarket Transistors NKT |
398 |
ASZ15 |
Ge-ALLOY-pnp TRANSISTOR |
IPRS Baneasa |
399 |
ASZ16 |
Ge-ALLOY-pnp TRANSISTOR |
IPRS Baneasa |
400 |
ASZ17 |
Ge-ALLOY-pnp TRANSISTOR |
IPRS Baneasa |
401 |
ASZ18 |
Ge-ALLOY-pnp TRANSISTOR |
IPRS Baneasa |
402 |
AUY31 |
Ge-ALLOY-pnp TRANSISTOR |
IPRS Baneasa |
403 |
AUY32 |
Ge-ALLOY-pnp TRANSISTOR |
IPRS Baneasa |
404 |
BA100 |
Small signal silicon diode (alloyed) |
mble |
405 |
BA114 |
Silicon Alloyed Junction Diode |
Philips |
406 |
BF167 |
Ge-ALLOY-pnp TRANSISTOR |
IPRS Baneasa |
407 |
CS2082 |
Dual Airbag Deployment ASIC |
ON Semiconductor |
408 |
CS2082-D |
Dual Airbag Deployment ASIC |
ON Semiconductor |
409 |
CS2082EDW20 |
Dual Airbag Deployment ASIC |
ON Semiconductor |
410 |
CS2082EDWR20 |
Dual Airbag Deployment ASIC |
ON Semiconductor |
411 |
CXY11A |
Ga As bulk effect devices employing the Gunn Effect to produce C.W. oscillations at microwave frequency |
Mullard |
412 |
CXY11B |
Ga As bulk effect devices employing the Gunn Effect to produce C.W. oscillations at microwave frequency |
Mullard |
413 |
CXY11C |
Ga As bulk effect devices employing the Gunn Effect to produce C.W. oscillations at microwave frequency |
Mullard |
414 |
CXY19 |
Ga As bulk effect devices employing the Gunn Effect to produce C.W. oscillations at microwave frequency |
Mullard |
415 |
CXY20 |
Ga As bulk effect devices employing the Gunn Effect to produce C.W. oscillations at microwave frequency |
Mullard |
416 |
EB4 HI TEMP |
High Temp (Glass Reinforced), Dual Readout, High Reliability Copper-Nickel-Tin Alloy Contacts or Gold Contacts, Recognized Under the Component Program of Underwriters' Laboratories Inc (File E65524) |
Vishay |
417 |
EB6 HI TEMP |
High Temp (Glass Reinforced), Dual Readout, High Reliability Copper-Nickel-Tin Alloy Contacts or Gold Contacts, Recognized Under the Component Program of Underwriters' Laboratories Inc (File E65524) |
Vishay |
418 |
EB7 HI TEMP |
High Temp (Glass Reinforced), Dual Readout, High Reliability Copper-Nickel-Tin Alloy Contacts or Gold Contacts, Recognized Under the Component Program of Underwriters' Laboratories Inc (File E65524) |
Vishay |
419 |
EB8 HI TEMP |
High Temp (Glass Reinforced), Dual Readout, High Reliability Copper-Nickel-Tin Alloy Contacts or Gold Contacts, Recognized Under the Component Program of Underwriters' Laboratories Inc (File E65524) |
Vishay |
420 |
EFT212 |
Power TRANSISTOR Ge-ALLOY-pnp |
IPRS Baneasa |
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