No. |
Part Name |
Description |
Manufacturer |
4411 |
SCAN921025SLC/NOPB |
30-80 MHz 10 Bit Bus LVDS Serializer with IEEE 1149.1 (JTAG) and at-speed BIST 49-NFBGA |
Texas Instruments |
4412 |
SCAN921025SLCX |
30MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access |
National Semiconductor |
4413 |
SCAN921224 |
20-66 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST |
National Semiconductor |
4414 |
SCAN921224 |
20-66 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST |
National Semiconductor |
4415 |
SCAN921224 |
20 MHz-66MHz 10-Bit Deserializer with IEEE 1149.1 Test Access |
Texas Instruments |
4416 |
SCAN921224SLC |
20 MHz-66MHz 10-Bit Deserializer with IEEE 1149.1 Test Access |
National Semiconductor |
4417 |
SCAN921224SLC |
20 MHz-66MHz 10-Bit Deserializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 85 |
Texas Instruments |
4418 |
SCAN921224SLC/NOPB |
20 MHz-66MHz 10-Bit Deserializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 85 |
Texas Instruments |
4419 |
SCAN921224SLCX |
20 MHz-66MHz 10-Bit Deserializer with IEEE 1149.1 Test Access |
National Semiconductor |
4420 |
SCAN921226 |
30-80 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST |
National Semiconductor |
4421 |
SCAN921226 |
30-80 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST |
National Semiconductor |
4422 |
SCAN921226 |
30-80 MHz 10 Bit Bus LVDS Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST 49-NFBGA |
Texas Instruments |
4423 |
SCAN921226H |
High Temperature 20MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access |
National Semiconductor |
4424 |
SCAN921226H |
High Temperature 20MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access |
Texas Instruments |
4425 |
SCAN921226HSM |
High Temperature 20MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access |
National Semiconductor |
4426 |
SCAN921226HSM |
High Temperature 20MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 125 |
Texas Instruments |
4427 |
SCAN921226HSM/NOPB |
High Temperature 20MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 125 |
Texas Instruments |
4428 |
SCAN921226HSMX |
High Temperature 20MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access |
National Semiconductor |
4429 |
SCAN921226SLC |
30MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access |
National Semiconductor |
4430 |
SCAN921226SLC/NOPB |
30-80 MHz 10 Bit Bus LVDS Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST 49-NFBGA |
Texas Instruments |
4431 |
SCAN921226SLCX |
30MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access |
National Semiconductor |
4432 |
SCAN921260 |
X6 1:10 Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST |
National Semiconductor |
4433 |
SCAN921260 |
six 1 to 10 deserializers with IEEE 1149.1 and at-speed BIST |
Texas Instruments |
4434 |
SCAN921260UJB |
six 1 to 10 deserializers with IEEE 1149.1 and at-speed BIST |
National Semiconductor |
4435 |
SCAN921260UJB/NOPB |
six 1 to 10 deserializers with IEEE 1149.1 and at-speed BIST 196-NFBGA -40 to 85 |
Texas Instruments |
4436 |
SCAN921260UJBX |
six 1 to 10 deserializers with IEEE 1149.1 and at-speed BIST |
National Semiconductor |
4437 |
SCAN921821 |
Dual 18-Bit Serializer with Pre-Emphasis, IEEE 1149.1 (JTAG), and At-Speed BIST |
National Semiconductor |
4438 |
SCAN921821 |
Dual 18-Bit Serializer with Pre-Emphasis, IEEE 1149.1 (JTAG), and At-Speed BIST |
Texas Instruments |
4439 |
SCAN921821EVK |
Dual 18-Bit Serializer with Pre-Emphasis, IEEE 1149.1 (JTAG), and At-Speed BIST |
National Semiconductor |
4440 |
SCAN921821SM |
3.3 V, dual 18-bit serializer with pre-emphasis, IEEE 1149.1 (JTAG) and at-speed BIST |
National Semiconductor |
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