No. |
Part Name |
Description |
Manufacturer |
4651 |
SN74AS878NT |
Dual 4-Bit D-Type Edge-Triggered Flip-Flops 24-PDIP 0 to 70 |
Texas Instruments |
4652 |
SN74AS879 |
Dual 4-Bit D-Type Edge-Triggered Flip-Flops 24-PDIP 0 to 70 |
Texas Instruments |
4653 |
SN74AS879NT |
Dual 4-Bit D-Type Edge-Triggered Flip-Flops 24-PDIP 0 to 70 |
Texas Instruments |
4654 |
SN74BCT374 |
Octal D-Type Edge-Triggered Flip-Flops |
Texas Instruments |
4655 |
SN74BCT374DBLE |
Octal D-Type Edge-Triggered Flip-Flops |
Texas Instruments |
4656 |
SN74BCT374DBR |
Octal D-Type Edge-Triggered Flip-Flops |
Texas Instruments |
4657 |
SN74BCT374DW |
Octal D-Type Edge-Triggered Flip-Flops |
Texas Instruments |
4658 |
SN74BCT374DWR |
Octal D-Type Edge-Triggered Flip-Flops |
Texas Instruments |
4659 |
SN74BCT374N |
Octal D-Type Edge-Triggered Flip-Flops |
Texas Instruments |
4660 |
SN74BCT374NE4 |
Octal D-Type Edge-Triggered Flip-Flops 20-PDIP 0 to 70 |
Texas Instruments |
4661 |
SN74BCT374NSR |
Octal D-Type Edge-Triggered Flip-Flops |
Texas Instruments |
4662 |
SN74BCT534 |
Octal D-Type Edge-Triggered Flip-Flops 20-SOIC 0 to 70 |
Texas Instruments |
4663 |
SN74BCT534DW |
Octal D-Type Edge-Triggered Flip-Flops 20-SOIC 0 to 70 |
Texas Instruments |
4664 |
SN74BCT534DWR |
Octal D-Type Edge-Triggered Flip-Flops 20-SOIC 0 to 70 |
Texas Instruments |
4665 |
SN74BCT534N |
Octal D-Type Edge-Triggered Flip-Flops 20-PDIP 0 to 70 |
Texas Instruments |
4666 |
SN74BCT574 |
Octal D-Type Edge-Triggered Flip-Flops |
Texas Instruments |
4667 |
SN74BCT574DBR |
Octal D-Type Edge-Triggered Flip-Flops |
Texas Instruments |
4668 |
SN74BCT574DW |
Octal D-Type Edge-Triggered Flip-Flops |
Texas Instruments |
4669 |
SN74BCT574DWR |
Octal D-Type Edge-Triggered Flip-Flops |
Texas Instruments |
4670 |
SN74BCT574N |
Octal D-Type Edge-Triggered Flip-Flops |
Texas Instruments |
4671 |
SN74BCT574NSR |
Octal D-Type Edge-Triggered Flip-Flops |
Texas Instruments |
4672 |
SN74BCT8374A |
Scan Test Device With Octal D-Type Edge-Triggered Flip-Flops |
Texas Instruments |
4673 |
SN74BCT8374ADW |
Scan Test Device With Octal D-Type Edge-Triggered Flip-Flops |
Texas Instruments |
4674 |
SN74BCT8374ADWR |
Scan Test Device With Octal D-Type Edge-Triggered Flip-Flops |
Texas Instruments |
4675 |
SN74BCT8374ANT |
Scan Test Device With Octal D-Type Edge-Triggered Flip-Flops |
Texas Instruments |
4676 |
SN74F109 |
Dual J-K Positive-Edge-Triggered Flip-Flops With Clear And Preset |
Texas Instruments |
4677 |
SN74F109D |
Dual J-K Positive-Edge-Triggered Flip-Flops With Clear And Preset |
Texas Instruments |
4678 |
SN74F109DR |
Dual J-K Positive-Edge-Triggered Flip-Flops With Clear And Preset |
Texas Instruments |
4679 |
SN74F109DRE4 |
Dual J-K Positive-Edge-Triggered Flip-Flops With Clear And Preset 16-SOIC 0 to 70 |
Texas Instruments |
4680 |
SN74F109DRG4 |
Dual J-K Positive-Edge-Triggered Flip-Flops With Clear And Preset 16-SOIC 0 to 70 |
Texas Instruments |
| | | |