| No. |
Part Name |
Description |
Manufacturer |
| 511 |
QL4090-3PQ240M |
90,000 usable PLD gate QuickRAM ESP combining performance, density and embedded RAM. |
QuickLogic |
| 512 |
QL4090-4CF208C |
90,000 usable PLD gate QuickRAM ESP combining performance, density and embedded RAM. |
QuickLogic |
| 513 |
QL4090-4CF208I |
90,000 usable PLD gate QuickRAM ESP combining performance, density and embedded RAM. |
QuickLogic |
| 514 |
QL4090-4CF208M |
90,000 usable PLD gate QuickRAM ESP combining performance, density and embedded RAM. |
QuickLogic |
| 515 |
QL4090-4PB456C |
90,000 usable PLD gate QuickRAM ESP combining performance, density and embedded RAM. |
QuickLogic |
| 516 |
QL4090-4PB456I |
90,000 usable PLD gate QuickRAM ESP combining performance, density and embedded RAM. |
QuickLogic |
| 517 |
QL4090-4PB456M |
90,000 usable PLD gate QuickRAM ESP combining performance, density and embedded RAM. |
QuickLogic |
| 518 |
QL4090-4PQ208C |
90,000 usable PLD gate QuickRAM ESP combining performance, density and embedded RAM. |
QuickLogic |
| 519 |
QL4090-4PQ208I |
90,000 usable PLD gate QuickRAM ESP combining performance, density and embedded RAM. |
QuickLogic |
| 520 |
QL4090-4PQ208M |
90,000 usable PLD gate QuickRAM ESP combining performance, density and embedded RAM. |
QuickLogic |
| 521 |
QL4090-4PQ240C |
90,000 usable PLD gate QuickRAM ESP combining performance, density and embedded RAM. |
QuickLogic |
| 522 |
QL4090-4PQ240I |
90,000 usable PLD gate QuickRAM ESP combining performance, density and embedded RAM. |
QuickLogic |
| 523 |
QL4090-4PQ240M |
90,000 usable PLD gate QuickRAM ESP combining performance, density and embedded RAM. |
QuickLogic |
| 524 |
TC11L003 |
300 usable gate, 1.5 micron, CMOS gate array |
TOSHIBA |
| 525 |
TC11L005 |
500 usable gate, 1.5 micron, CMOS gate array |
TOSHIBA |
| 526 |
TC11L007 |
700 usable gate, 1.5 micron, CMOS gate array |
TOSHIBA |
| 527 |
TC14L010 |
1 K usable gate, 1.0 micron, CMOS gate array |
TOSHIBA |
| 528 |
TC14L020 |
2 K usable gate, 1.0 micron, CMOS gate array |
TOSHIBA |
| 529 |
TC14L040 |
4 K usable gate, 1.0 micron, CMOS gate array |
TOSHIBA |
| 530 |
TC14L050 |
5 K usable gate, 1.0 micron, CMOS gate array |
TOSHIBA |
| 531 |
TC14L060 |
6 K usable gate, 1.0 micron, CMOS gate array |
TOSHIBA |
| 532 |
TC14L070 |
7 K usable gate, 1.0 micron, CMOS gate array |
TOSHIBA |
| 533 |
TC14L080 |
8 K usable gate, 1.0 micron, CMOS gate array |
TOSHIBA |
| 534 |
TC14L100 |
8 K usable gate, 1.0 micron, CMOS gate array |
TOSHIBA |
| 535 |
TPS2557-Q1 |
Precison Automotive Adjusable Current-Limited Power-Distribution Switch 8-SON -40 to 125 |
Texas Instruments |
| 536 |
TPS2557QDRBRQ1 |
Precison Automotive Adjusable Current-Limited Power-Distribution Switch 8-SON -40 to 125 |
Texas Instruments |
| 537 |
TPS2557QDRBTQ1 |
Precison Automotive Adjusable Current-Limited Power-Distribution Switch 8-SON -40 to 125 |
Texas Instruments |
| 538 |
USAB10ID78K0 |
Integrated debugger for the 78K/0 series |
NEC |
| 539 |
USAB10ID78K3 |
Integrated debugger for 78K/3 series |
NEC |
| 540 |
USAB10ID78K4 |
Integrated debugger for the 78K/4 series |
NEC |
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