| No. |
Part Name |
Description |
Manufacturer |
| 5251 |
SN74BCT541ADWE4 |
Octal Buffers/Drivers With 3-State Outputs 20-SOIC 0 to 70 |
Texas Instruments |
| 5252 |
SN74BCT541ADWG4 |
Octal Buffers/Drivers With 3-State Outputs 20-SOIC 0 to 70 |
Texas Instruments |
| 5253 |
SN74BCT541ADWR |
Octal Buffers/Drivers With 3-State Outputs |
Texas Instruments |
| 5254 |
SN74BCT541AN |
Octal Buffers/Drivers With 3-State Outputs |
Texas Instruments |
| 5255 |
SN74BCT541ANE4 |
Octal Buffers/Drivers With 3-State Outputs 20-PDIP 0 to 70 |
Texas Instruments |
| 5256 |
SN74BCT541ANSR |
Octal Buffers/Drivers With 3-State Outputs |
Texas Instruments |
| 5257 |
SN74BCT756 |
Octal Buffers And Line Drivers With Open Collector Outputs |
Texas Instruments |
| 5258 |
SN74BCT756DW |
Octal Buffers And Line Drivers With Open Collector Outputs |
Texas Instruments |
| 5259 |
SN74BCT756DWR |
Octal Buffers And Line Drivers With Open Collector Outputs |
Texas Instruments |
| 5260 |
SN74BCT756N |
Octal Buffers And Line Drivers With Open Collector Outputs |
Texas Instruments |
| 5261 |
SN74BCT760 |
Octal Buffers/Drivers With Open-Collector Outputs |
Texas Instruments |
| 5262 |
SN74BCT760DW |
Octal Buffers/Drivers With Open-Collector Outputs |
Texas Instruments |
| 5263 |
SN74BCT760DWG4 |
Octal Buffers/Drivers With Open-Collector Outputs 20-SOIC 0 to 70 |
Texas Instruments |
| 5264 |
SN74BCT760DWR |
Octal Buffers/Drivers With Open-Collector Outputs |
Texas Instruments |
| 5265 |
SN74BCT760DWRG4 |
Octal Buffers/Drivers With Open-Collector Outputs 20-SOIC 0 to 70 |
Texas Instruments |
| 5266 |
SN74BCT760N |
Octal Buffers/Drivers With Open-Collector Outputs |
Texas Instruments |
| 5267 |
SN74BCT760NSR |
Octal Buffers/Drivers With Open-Collector Outputs |
Texas Instruments |
| 5268 |
SN74BCT8240A |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Inverting Buffers |
Texas Instruments |
| 5269 |
SN74BCT8240ADW |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Inverting Buffers |
Texas Instruments |
| 5270 |
SN74BCT8240ADWR |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Inverting Buffers |
Texas Instruments |
| 5271 |
SN74BCT8240ANT |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Inverting Buffers |
Texas Instruments |
| 5272 |
SN74BCT8244A |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers |
Texas Instruments |
| 5273 |
SN74BCT8244ADW |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers |
Texas Instruments |
| 5274 |
SN74BCT8244ADWE4 |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers 24-SOIC 0 to 70 |
Texas Instruments |
| 5275 |
SN74BCT8244ADWR |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers |
Texas Instruments |
| 5276 |
SN74BCT8244ANT |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers |
Texas Instruments |
| 5277 |
SN74F2244DBLE |
25-OHM OCTAL BUFFERS/DRIVERS WITH 3-STATE OUTPUTS |
Texas Instruments |
| 5278 |
SN74F2244DBR |
25-OHM OCTAL BUFFERS/DRIVERS WITH 3-STATE OUTPUTS |
Texas Instruments |
| 5279 |
SN74F2244DWR |
25-OHM OCTAL BUFFERS/DRIVERS WITH 3-STATE OUTPUTS |
Texas Instruments |
| 5280 |
SN74F2244N |
25-OHM OCTAL BUFFERS/DRIVERS WITH 3-STATE OUTPUTS |
Texas Instruments |
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