| No. |
Part Name |
Description |
Manufacturer |
| 541 |
SNJ54ABT827FK |
10-Bit Buffers/Drivers With 3-State Outputs |
Texas Instruments |
| 542 |
SNJ54ABT827JT |
10-Bit Buffers/Drivers With 3-State Outputs |
Texas Instruments |
| 543 |
SNJ54ABT827W |
10-Bit Buffers/Drivers With 3-State Outputs |
Texas Instruments |
| 544 |
SNJ54ABT841FK |
10-Bit Bus-Interface D-type Latches With 3-State Outputs |
Texas Instruments |
| 545 |
SNJ54ABT841JT |
10-Bit Bus-Interface D-type Latches With 3-State Outputs |
Texas Instruments |
| 546 |
SNJ54ABT841W |
10-Bit Bus-Interface D-type Latches With 3-State Outputs |
Texas Instruments |
| 547 |
SNJ54ABT843FK |
9-Bit Bus-Interface D-type Latches With 3-State Outputs |
Texas Instruments |
| 548 |
SNJ54ABT843JT |
9-Bit Bus-Interface D-type Latches With 3-State Outputs |
Texas Instruments |
| 549 |
SNJ54ABT843W |
9-Bit Bus-Interface D-type Latches With 3-State Outputs |
Texas Instruments |
| 550 |
SNJ54ABT853FK |
8-Bit To 9-Bit Parity Bus Transceivers |
Texas Instruments |
| 551 |
SNJ54ABT853JT |
8-Bit To 9-Bit Parity Bus Transceivers |
Texas Instruments |
| 552 |
SNJ54ABT853W |
8-Bit To 9-Bit Parity Bus Transceivers |
Texas Instruments |
| 553 |
SNJ54ABT8543FK |
Scan Test Devices With Octal Registered Bus Tranceivers |
Texas Instruments |
| 554 |
SNJ54ABT8543JT |
Scan Test Devices With Octal Registered Bus Tranceivers |
Texas Instruments |
| 555 |
SNJ54ABT8646FK |
Scan Test Devices With Octal Bus Transceivers And Registers |
Texas Instruments |
| 556 |
SNJ54ABT8646JT |
Scan Test Devices With Octal Bus Transceivers And Registers |
Texas Instruments |
| 557 |
SNJ54ABT8652FK |
Scan Test Devices With Octal Bus Transceivers And Registers |
Texas Instruments |
| 558 |
SNJ54ABT8652JT |
Scan Test Devices With Octal Bus Transceivers And Registers |
Texas Instruments |
| 559 |
SNJ54ABT8996FK |
10-Bit Addressable Scan Ports Multidrop-Addressable IEEE 1149.1 |
Texas Instruments |
| 560 |
SNJ54ABT8996JT |
10-Bit Addressable Scan Ports Multidrop-Addressable IEEE 1149.1 |
Texas Instruments |
| 561 |
SNJ54ABT8996W |
10-Bit Addressable Scan Ports Multidrop-Addressable IEEE 1149.1 |
Texas Instruments |
| 562 |
SNJ54ABTE16245WD |
16-Bit Incident-Wave Switching Bus Transceivers With 3-State Outputs |
Texas Instruments |
| 563 |
SNJ54ABTH16244WD |
16-Bit Buffers/Drivers With 3-State Outputs |
Texas Instruments |
| 564 |
SNJ54ABTH16245WD |
16-BIT BUS TRANSCEIVERS WITH 3-STATE OUTPUTS |
Texas Instruments |
| 565 |
SNJ54ABTH18502AHV |
Scan Test Devices With 18-Bit Universal Bus Transceivers |
Texas Instruments |
| 566 |
SNJ54ABTH18646AHV |
Scan Test Devices With 18-Bit Transceivers And Registers |
Texas Instruments |
| 567 |
SNJ54ABTH245FK |
Octal Bus Transceivers With 3-State Outputs |
Texas Instruments |
| 568 |
SNJ54ABTH245J |
Octal Bus Transceivers With 3-State Outputs |
Texas Instruments |
| 569 |
SNJ54ABTH245W |
Octal Bus Transceivers With 3-State Outputs |
Texas Instruments |
| 570 |
SNJ54ABTH32316HT |
16-Bit Tri-Port Universal Bus Exchangers |
Texas Instruments |
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