| No. |
Part Name |
Description |
Manufacturer |
| 541 |
D..P/CRCW |
Metal Glaze on High Quality Ceramic, Protective Over Glaze, SnPb Contacts on Ni Barrier Layer, Excellent Stability at Different Environmental Conditions |
Vishay |
| 542 |
DFM14 |
Military, MIL-R-83401 Qualified, Type RZ, 11, 12, 15 Schematics, Hot Solder Dip, Highly Stable, Passes MIL-STD-202 Method 210, Condition E ""Resistance to Soldering Heat"" Test |
Vishay |
| 543 |
DFP14 |
Military, Hot Solder Dip or Gold Plated Leads, Highly Stable, Passes MIL-STD-202 Method 210, Condition E ""Resistance to Soldering Heat"" Test |
Vishay |
| 544 |
DFP16 |
Military, Hot Solder Dip or Gold Plated Leads, Highly Stable, Passes MIL-STD-202 Method 210, Condition E ""Resistance to Soldering Heat"" Test |
Vishay |
| 545 |
DPM40 |
A compact Low-Cost LED Module ideally suited for applications where a Bright Display Under All Conditions is Required |
etc |
| 546 |
DRV401 |
Sensor Signal Conditioning for Closed-Loop Magnetic Current Sensor |
Texas Instruments |
| 547 |
DRV401-EP |
Enhanced Product Sensor Signal Conditioning for Closed-Loop Magnetic Current Sensor |
Texas Instruments |
| 548 |
DRV401AIDWP |
Sensor Signal Conditioning IC for Closed-Loop Fluxgate Sensor Applications 20-SO PowerPAD -40 to 125 |
Texas Instruments |
| 549 |
DRV401AIDWPG4 |
Sensor Signal Conditioning IC for Closed-Loop Fluxgate Sensor Applications 20-SO PowerPAD -40 to 125 |
Texas Instruments |
| 550 |
DRV401AIDWPR |
Sensor Signal Conditioning IC for Closed-Loop Fluxgate Sensor Applications 20-SO PowerPAD -40 to 125 |
Texas Instruments |
| 551 |
DRV401AIDWPRG4 |
Sensor Signal Conditioning IC for Closed-Loop Fluxgate Sensor Applications 20-SO PowerPAD -40 to 125 |
Texas Instruments |
| 552 |
DRV401AIRGWR |
Sensor Signal Conditioning IC for Closed-Loop Fluxgate Sensor Applications 20-VQFN -40 to 125 |
Texas Instruments |
| 553 |
DRV401AIRGWRG4 |
Sensor Signal Conditioning IC for Closed-Loop Fluxgate Sensor Applications 20-VQFN -40 to 125 |
Texas Instruments |
| 554 |
DRV401AIRGWT |
Sensor Signal Conditioning IC for Closed-Loop Fluxgate Sensor Applications 20-VQFN -40 to 125 |
Texas Instruments |
| 555 |
DRV401AIRGWTG4 |
Sensor Signal Conditioning IC for Closed-Loop Fluxgate Sensor Applications 20-VQFN -40 to 125 |
Texas Instruments |
| 556 |
DRV401AMDWPREP |
Enhanced Product Sensor Signal Conditioning for Closed-Loop Magnetic Current Sensor 20-SO PowerPAD -55 to 125 |
Texas Instruments |
| 557 |
DRV411 |
Sensor Signal Conditioning IC for Closed-Loop Magnetic Current Sensors |
Texas Instruments |
| 558 |
DRV411AIPWP |
Sensor Signal Conditioning IC for Closed-Loop Hall-Effect Sensor Applications 20-HTSSOP -40 to 125 |
Texas Instruments |
| 559 |
DRV411AIPWPR |
Sensor Signal Conditioning IC for Closed-Loop Hall-Effect Sensor Applications 20-HTSSOP -40 to 125 |
Texas Instruments |
| 560 |
DRV411AIRGPR |
Sensor Signal Conditioning IC for Closed-Loop Hall-Effect Sensor Applications 20-QFN -40 to 125 |
Texas Instruments |
| 561 |
DRV411AIRGPT |
Sensor Signal Conditioning IC for Closed-Loop Hall-Effect Sensor Applications 20-QFN -40 to 125 |
Texas Instruments |
| 562 |
DS26F32ME/883 |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
| 563 |
DS26F32MER-QML |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
| 564 |
DS26F32MJ-QMLV |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
| 565 |
DS26F32MJR-QML |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
| 566 |
DS26F32MJRQMLV |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
| 567 |
DS26F32MW-QMLV |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
| 568 |
DS26F32MWG/883 |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
| 569 |
DS26F32MWGRQMLV |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
| 570 |
DS26F32MWR-QML |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
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