| No. |
Part Name |
Description |
Manufacturer |
| 541 |
DS33X162DK |
Demo Kit for the DS33X162 |
MAXIM - Dallas Semiconductor |
| 542 |
DS33Z11DK |
Demo Kit for the DS33Z11 |
MAXIM - Dallas Semiconductor |
| 543 |
DS34S132DK |
Evaluation Kit for the DS34S132 |
MAXIM - Dallas Semiconductor |
| 544 |
DS4424EVKIT |
Evaluation Kit for the DS4422 and DS4424 |
MAXIM - Dallas Semiconductor |
| 545 |
DS4424EVKIT# |
Evaluation Kit for the DS4422 and DS4424 |
MAXIM - Dallas Semiconductor |
| 546 |
DS5250-KIT |
Evaluation Kit for the DS5250 |
MAXIM - Dallas Semiconductor |
| 547 |
DS8005-KIT |
Evaluation Kit for the DS8005 |
MAXIM - Dallas Semiconductor |
| 548 |
DS8005-KIT# |
Evaluation Kit for the DS8005 |
MAXIM - Dallas Semiconductor |
| 549 |
DS8113-KIT |
EMV Evaluation Kit for the DS8113 |
MAXIM - Dallas Semiconductor |
| 550 |
DS8500-KIT |
Evaluation Kit for the DS8500 |
MAXIM - Dallas Semiconductor |
| 551 |
DS8500-KIT# |
Evaluation Kit for the DS8500 |
MAXIM - Dallas Semiconductor |
| 552 |
DS89C450-KIT |
Evaluation Kit for the DS89C450 |
MAXIM - Dallas Semiconductor |
| 553 |
DS89C450-KIT# |
Evaluation Kit for the DS89C450 |
MAXIM - Dallas Semiconductor |
| 554 |
DSAUTHSK |
Evaluation Kit for the DS28E01-100, DS28CN01, and DS2460 |
MAXIM - Dallas Semiconductor |
| 555 |
DSAUTHSK# |
Evaluation Kit for the DS28E01-100, DS28CN01, and DS2460 |
MAXIM - Dallas Semiconductor |
| 556 |
DSP1620 |
Clarification to the Serial I/O Control Register Description for the DSP1620/27/28/29 Devices |
Agere Systems |
| 557 |
DSP1627 |
Clarification to the Serial I/O Control Register Description for the DSP1620/27/28/29 Devices |
Agere Systems |
| 558 |
DSP1628 |
Clarification to the Serial I/O Control Register Description for the DSP1620/27/28/29 Devices |
Agere Systems |
| 559 |
DSP1629 |
Clarification to the Serial I/O Control Register Description for the DSP1620/27/28/29 Devices |
Agere Systems |
| 560 |
EB311 |
In-Circuit Programming of FLASH Memory Using the Monitor Mode for the MC68HC908SR12 |
Motorola |
| 561 |
EB4 |
Dual Readout, Standard and Right Angle Terminals, Selective Gold Plating, Polarization Between Contact Positions, Recognized Under the Component Program of Underwriters' Laboratories Inc (File E65524, Project 77CH3889) |
Vishay |
| 562 |
EB4 HI TEMP |
High Temp (Glass Reinforced), Dual Readout, High Reliability Copper-Nickel-Tin Alloy Contacts or Gold Contacts, Recognized Under the Component Program of Underwriters' Laboratories Inc (File E65524) |
Vishay |
| 563 |
EB6 |
Dual Readout, Standard and Right Angle Terminals, Selective Gold Plating, Polarization Between Contact Positions, Recognized Under the Component Program of Underwriters' Laboratories Inc (File E65524, Project 77CH3889) |
Vishay |
| 564 |
EB6 HI TEMP |
High Temp (Glass Reinforced), Dual Readout, High Reliability Copper-Nickel-Tin Alloy Contacts or Gold Contacts, Recognized Under the Component Program of Underwriters' Laboratories Inc (File E65524) |
Vishay |
| 565 |
EB7 HI TEMP |
High Temp (Glass Reinforced), Dual Readout, High Reliability Copper-Nickel-Tin Alloy Contacts or Gold Contacts, Recognized Under the Component Program of Underwriters' Laboratories Inc (File E65524) |
Vishay |
| 566 |
EB8 |
Dual Readout, Selective Gold Plating, Polarization Between Contact Positions, Recognized Under the Component Program of Underwriters' Laboratories Inc (File E65524, Project 77CH3889) |
Vishay |
| 567 |
EB8 HI TEMP |
High Temp (Glass Reinforced), Dual Readout, High Reliability Copper-Nickel-Tin Alloy Contacts or Gold Contacts, Recognized Under the Component Program of Underwriters' Laboratories Inc (File E65524) |
Vishay |
| 568 |
EIMR-EVAL-KT |
Evaluation Kit for the Am79C984A Device |
Advanced Micro Devices |
| 569 |
EL7300Q-110 |
highly integrated single chip solution for the Flat Panel Display applications |
Etron Tech |
| 570 |
EL7300Q-140 |
highly integrated single chip solution for the Flat Panel Display applications |
Etron Tech |
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