No. |
Part Name |
Description |
Manufacturer |
541 |
SN74ABT8996DW |
10-Bit Addressable Scan Ports Multidrop-Addressable IEEE STD 1194.1 (JTAG) TAP Transceivers |
Texas Instruments |
542 |
SN74ABT8996DWR |
10-Bit Addressable Scan Ports Multidrop-Addressable IEEE STD 1194.1 (JTAG) TAP Transceivers |
Texas Instruments |
543 |
SN74ABT8996PW |
10-Bit Addressable Scan Ports Multidrop-Addressable IEEE STD 1194.1 (JTAG) TAP Transceivers |
Texas Instruments |
544 |
SN74ABT8996PWLE |
10-Bit Addressable Scan Ports Multidrop-Addressable IEEE STD 1194.1 (JTAG) TAP Transceivers |
Texas Instruments |
545 |
SN74ABT8996PWR |
10-Bit Addressable Scan Ports Multidrop-Addressable IEEE STD 1194.1 (JTAG) TAP Transceivers |
Texas Instruments |
546 |
SN74ACT8990 |
Test-Bus Controllers IEEE Std 1149.1 (JTAG) TAP Masters With 16-Bit Generic Host Interfaces |
Texas Instruments |
547 |
SN74ACT8990FN |
Test-Bus Controllers IEEE Std 1149.1 (JTAG) TAP Masters With 16-Bit Generic Host Interfaces |
Texas Instruments |
548 |
SN74ACT8990FNR |
Test-Bus Controllers IEEE Std 1149.1 (JTAG) TAP Masters With 16-Bit Generic Host Interfaces |
Texas Instruments |
549 |
SN74ACT8994 |
DIGITAL BUS MONITOR IEEE STD 1149.1 JTAG SCAN-CONTROLLED LOGIC/SIGNATURE ANALYZER |
Texas Instruments |
550 |
SN74ACT8994FN |
DIGITAL BUS MONITOR IEEE STD 1149.1 JTAG SCAN-CONTROLLED LOGIC/SIGNATURE ANALYZER |
Texas Instruments |
551 |
SN74BCT8240A |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Inverting Buffers |
Texas Instruments |
552 |
SN74BCT8240ADW |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Inverting Buffers |
Texas Instruments |
553 |
SN74BCT8240ADWR |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Inverting Buffers |
Texas Instruments |
554 |
SN74BCT8240ANT |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Inverting Buffers |
Texas Instruments |
555 |
SN74BCT8244A |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers |
Texas Instruments |
556 |
SN74BCT8244ADW |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers |
Texas Instruments |
557 |
SN74BCT8244ADWE4 |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers 24-SOIC 0 to 70 |
Texas Instruments |
558 |
SN74BCT8244ADWR |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers |
Texas Instruments |
559 |
SN74BCT8244ANT |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers |
Texas Instruments |
560 |
SN74BCT8245A |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Bus Transceivers |
Texas Instruments |
561 |
SN74BCT8245ADW |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Bus Transceivers |
Texas Instruments |
562 |
SN74BCT8245ADWR |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Bus Transceivers |
Texas Instruments |
563 |
SN74BCT8245ANT |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Bus Transceivers |
Texas Instruments |
564 |
SN74BCT8373A |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches |
Texas Instruments |
565 |
SN74BCT8373ADW |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches |
Texas Instruments |
566 |
SN74BCT8373ADWR |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches |
Texas Instruments |
567 |
SN74BCT8373ANT |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches |
Texas Instruments |
568 |
SN74LVCZ161284A |
19-Bit IEEE 1284 Std Bus Interface |
Texas Instruments |
569 |
SN74LVCZ161284AGR |
19-Bit IEEE 1284 Std Bus Interface |
Texas Instruments |
570 |
SN74LVT8980 |
EMBEDDED TEST-BUS CONTROLLERS IEEE STD 1149.1 JTAG TAP MASTERS WITH 8-BIT GENERIC HOST INTERFACES |
Texas Instruments |
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