No. |
Part Name |
Description |
Manufacturer |
61 |
HS-A82A-FREQ |
ECL-100K ECL Supplement |
NEL Frequency Controls |
62 |
HS-A82B-FREQ |
ECL-100K ECL Supplement |
NEL Frequency Controls |
63 |
HS-A82C-FREQ |
ECL-100K ECL Supplement |
NEL Frequency Controls |
64 |
HS830 |
ECL-100K ECL Supplement |
NEL Frequency Controls |
65 |
LM136AH-2.5-SMD |
2.5V REFERENCE DIODE, GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5 |
National Semiconductor |
66 |
LM136AH-2.5RQML |
2.5V REFERENCE DIODE, GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5 |
National Semiconductor |
67 |
LM136AH-2.5RQV |
2.5V REFERENCE DIODE, GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5 |
National Semiconductor |
68 |
LM136H |
2.5V REFERENCE DIODE/ GUARANTEED TO 100K RADSi TESTED TO MIL-STD-883/ METHOD 1019.5 |
National Semiconductor |
69 |
MAX5490 |
100k Precision-Matched Resistor-Divider in SOT23 |
MAXIM - Dallas Semiconductor |
70 |
MAX5490PA02500-T |
100k ��Precision-Matched Resistor-Divider in SOT23 |
MAXIM - Dallas Semiconductor |
71 |
MAX5490RB03000-T |
100k ��Precision-Matched Resistor-Divider in SOT23 |
MAXIM - Dallas Semiconductor |
72 |
MAX5490UA07538-T |
100k ��Precision-Matched Resistor-Divider in SOT23 |
MAXIM - Dallas Semiconductor |
73 |
MAX5490VC10000-T |
100k ��Precision-Matched Resistor-Divider in SOT23 |
MAXIM - Dallas Semiconductor |
74 |
MLX90247C |
Thermopile with 100K NTC thermistor |
Melexis |
75 |
MN100325DMQB |
HEX Input voltage (DC): -05 to 6.0V; -50mA; ECL-to-TTL translator for converting F100K logic level to TTL logic levels |
National Semiconductor |
76 |
MN100325FMQB |
HEX Input voltage (DC): -05 to 6.0V; -50mA; ECL-to-TTL translator for converting F100K logic level to TTL logic levels |
National Semiconductor |
77 |
MN100325J-QMLV |
HEX Input voltage (DC): -05 to 6.0V; -50mA; ECL-to-TTL translator for converting F100K logic level to TTL logic levels |
National Semiconductor |
78 |
MN100325W-QMLV |
HEX Input voltage (DC): -05 to 6.0V; -50mA; ECL-to-TTL translator for converting F100K logic level to TTL logic levels |
National Semiconductor |
79 |
MN100325WFQMLV |
HEX Input voltage (DC): -05 to 6.0V; -50mA; ECL-to-TTL translator for converting F100K logic level to TTL logic levels |
National Semiconductor |
80 |
MNDS26F32M-X-RH |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
81 |
MNDS26F32ME/883 |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
82 |
MNDS26F32MER-QML |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
83 |
MNDS26F32MJ-QMLV |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
84 |
MNDS26F32MJ/883 |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
85 |
MNDS26F32MJR-QML |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
86 |
MNDS26F32MJRQMLV |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
87 |
MNDS26F32MW-QMLV |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
88 |
MNDS26F32MW/883 |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
89 |
MNDS26F32MWG/883 |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
90 |
MNDS26F32MWGRQMLV |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
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