No. |
Part Name |
Description |
Manufacturer |
61 |
5962-9571101QXA |
Negative Low Dropout Regulator |
National Semiconductor |
62 |
5962-9571101QXA |
Negative Low Dropout Regulator |
National Semiconductor |
63 |
5962-9571101QXA |
Negative Low Dropout Regulator |
National Semiconductor |
64 |
5962-9681101QXA |
3.3-V ABT Scan Test Devices With 18-Bit Universal Bus Transceivers |
Texas Instruments |
65 |
5962-9751101Q2A |
Advanced LinCMOS(TM) Rail-To-Rail Output Wide-Input-Voltage Dual Operational Amplifier |
Texas Instruments |
66 |
5962-9751101QHA |
Advanced LinCMOS(TM) Rail-To-Rail Output Wide-Input-Voltage Dual Operational Amplifier |
Texas Instruments |
67 |
5962-9751101QPA |
Advanced LinCMOS(TM) Rail-To-Rail Output Wide-Input-Voltage Dual Operational Amplifier |
Texas Instruments |
68 |
5962-9861101Q2A |
Line Drivers |
Texas Instruments |
69 |
5962-9861101QCA |
Line Drivers |
Texas Instruments |
70 |
5962-9861101QDA |
Line Drivers |
Texas Instruments |
71 |
5962D0151101QXC |
512K32 16Megabit SRAM MCM: SDM. 25ns access time, 5.0V operation. Lead finish gold. QML class Q. Total dose 1E4(10krad(Si)). |
Aeroflex Circuit Technology |
72 |
5962D0151101TXC |
512K32 16Megabit SRAM MCM: SDM. 25ns access time, 5.0V operation. Lead finish gold. QML class T. Total dose 1E4(10krad(Si)). |
Aeroflex Circuit Technology |
73 |
5962F9671101VXC |
Radiation Hardened EDAC (Error Detection and Correction Circuit) |
Intersil |
74 |
5962F9671101VYC |
Radiation Hardened EDAC (Error Detection and Correction Circuit) |
Intersil |
75 |
5962L0151101QXC |
512K32 16Megabit SRAM MCM: SDM. 25ns access time, 5.0V operation. Lead finish gold. QML class Q. Total dose 5E4(50krad(Si)). |
Aeroflex Circuit Technology |
76 |
5962L0151101TXC |
512K32 16Megabit SRAM MCM: SDM. 25ns access time, 5.0V operation. Lead finish gold. QML class T. Total dose 5E4(50krad(Si)). |
Aeroflex Circuit Technology |
77 |
5962P0151101QXC |
512K32 16Megabit SRAM MCM: SDM. 25ns access time, 5.0V operation. Lead finish gold. QML class Q. Total dose 3E4(30krad(Si)). |
Aeroflex Circuit Technology |
78 |
5962P0151101TXC |
512K32 16Megabit SRAM MCM: SDM. 25ns access time, 5.0V operation. Lead finish gold. QML class T. Total dose 3E4(30krad(Si)). |
Aeroflex Circuit Technology |
79 |
74AC11010 |
Triple 3-Input Positive-NAND Gates 16-SOIC -40 to 85 |
Texas Instruments |
80 |
74AC11010D |
Triple 3-Input Positive-NAND Gates 16-SOIC -40 to 85 |
Texas Instruments |
81 |
74AC11010DR |
Triple 3-Input Positive-NAND Gates 16-SOIC -40 to 85 |
Texas Instruments |
82 |
74AC11010N |
Triple 3-Input Positive-NAND Gates 16-PDIP -40 to 85 |
Texas Instruments |
83 |
74AC11011 |
TRIPLE 3-INPUT POSITIVE-AND GATES |
Texas Instruments |
84 |
74AC11011D |
Triple 3-Input Positive-AND Gates 16-SOIC -40 to 85 |
Texas Instruments |
85 |
74AC11011DR |
Triple 3-Input Positive-AND Gates 16-SOIC -40 to 85 |
Texas Instruments |
86 |
74AC11011N |
Triple 3-Input Positive-AND Gates 16-PDIP -40 to 85 |
Texas Instruments |
87 |
74AC11013 |
DUAL 4 INPUT NAND SCHMITT TRIGGER |
Philips |
88 |
74AC11013 |
Dual 4-Input Positive-NAND Gates With Schmitt-Trigger 14-PDIP -40 to 85 |
Texas Instruments |
89 |
74AC11013D |
DUAL 4 INPUT NAND SCHMITT TRIGGER |
Philips |
90 |
74AC11013D |
Dual 4-Input Positive-NAND Gates With Schmitt-Trigger 14-SOIC -40 to 85 |
Texas Instruments |
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