| No. |
Part Name |
Description |
Manufacturer |
| 61 |
C7300-10-12NPD |
12-bit; MAX 250Hz readout (1280x16); 1.3 Mpixels; high performance digital CCD camera |
Hamamatsu Corporation |
| 62 |
C7300-10-12NR |
12-bit; MAX 250Hz readout (1280x16); 1.3 Mpixels; high performance digital CCD camera |
Hamamatsu Corporation |
| 63 |
C7300-10-12NRP |
12-bit; MAX 250Hz readout (1280x16); 1.3 Mpixels; high performance digital CCD camera |
Hamamatsu Corporation |
| 64 |
C7300-10-12NRU |
12-bit; MAX 250Hz readout (1280x16); 1.3 Mpixels; high performance digital CCD camera |
Hamamatsu Corporation |
| 65 |
CXD1250M |
Example of Combination of Frame Readout System CCD Image Sensor and System IC |
SONY |
| 66 |
CXD1254AR |
Example of Combination of Frame Readout System CCD Image Sensor and System IC |
SONY |
| 67 |
CXD2470R |
Timing Generator for Frame Readout |
SONY |
| 68 |
CXD2492R |
Timing Generator for Frame Readout CCD Image |
SONY |
| 69 |
CXD2497R |
Timing Generator for Frame Readout |
SONY |
| 70 |
CXD2498R |
Timing Generator for Frame Readout CCD |
SONY |
| 71 |
CXD3408 |
Timing Generator and Signal Processor for Frame Readout CCD Image Sensor |
SONY |
| 72 |
CXD3410 |
Timing Generator and Signal Processor for Frame Readout CCD Image Sensor |
SONY |
| 73 |
CXD3412 |
Timing Generator and Signal Processor for Frame Readout CCD Image Sensor |
SONY |
| 74 |
CXD3605R |
Timing Generator for Frame Readout |
SONY |
| 75 |
CXD3606R |
Timing Generator for Frame Readout |
SONY |
| 76 |
CXD3611R |
Timing Generator for Frame Readout |
SONY |
| 77 |
CXD3615R |
Timing Generator for Frame Readout CCD Image Sensor |
SONY |
| 78 |
CXD3619R |
Timing Generator for Frame Readout CCD Image Sensor |
SONY |
| 79 |
DRV425 |
Fully Integrated Precision Fluxgate Magnetic Field Sensor and readout 20-QFN -40 to 125 |
Texas Instruments |
| 80 |
DRV425RTJR |
Fully Integrated Precision Fluxgate Magnetic Field Sensor and readout 20-QFN -40 to 125 |
Texas Instruments |
| 81 |
DRV425RTJT |
Fully Integrated Precision Fluxgate Magnetic Field Sensor and readout 20-QFN -40 to 125 |
Texas Instruments |
| 82 |
EB4 |
Dual Readout, Standard and Right Angle Terminals, Selective Gold Plating, Polarization Between Contact Positions, Recognized Under the Component Program of Underwriters' Laboratories Inc (File E65524, Project 77CH3889) |
Vishay |
| 83 |
EB4 HI TEMP |
High Temp (Glass Reinforced), Dual Readout, High Reliability Copper-Nickel-Tin Alloy Contacts or Gold Contacts, Recognized Under the Component Program of Underwriters' Laboratories Inc (File E65524) |
Vishay |
| 84 |
EB6 |
Dual Readout, Standard and Right Angle Terminals, Selective Gold Plating, Polarization Between Contact Positions, Recognized Under the Component Program of Underwriters' Laboratories Inc (File E65524, Project 77CH3889) |
Vishay |
| 85 |
EB6 HI TEMP |
High Temp (Glass Reinforced), Dual Readout, High Reliability Copper-Nickel-Tin Alloy Contacts or Gold Contacts, Recognized Under the Component Program of Underwriters' Laboratories Inc (File E65524) |
Vishay |
| 86 |
EB7 HI TEMP |
High Temp (Glass Reinforced), Dual Readout, High Reliability Copper-Nickel-Tin Alloy Contacts or Gold Contacts, Recognized Under the Component Program of Underwriters' Laboratories Inc (File E65524) |
Vishay |
| 87 |
EB7D |
Dual Readout, Selective Gold Plating, Polarization Between Contact Positions, Polarizing Key is Reinforced Nylon, Protected Entry |
Vishay |
| 88 |
EB7S |
Single Readout, Selective Gold Plating, Polarization Between Contact Positions, Polarizing Key is Reinforced Nylon, Protected Entry |
Vishay |
| 89 |
EB8 |
Dual Readout, Selective Gold Plating, Polarization Between Contact Positions, Recognized Under the Component Program of Underwriters' Laboratories Inc (File E65524, Project 77CH3889) |
Vishay |
| 90 |
EB8 HI TEMP |
High Temp (Glass Reinforced), Dual Readout, High Reliability Copper-Nickel-Tin Alloy Contacts or Gold Contacts, Recognized Under the Component Program of Underwriters' Laboratories Inc (File E65524) |
Vishay |
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