No. |
Part Name |
Description |
Manufacturer |
61 |
IDT74FCT824BSO |
HIGH-PERFORMANCE CMOS BUS INTERFACE REGISTERS |
IDT |
62 |
IDT74FCT824BSOB |
HIGH-PERFORMANCE CMOS BUS INTERFACE REGISTERS |
IDT |
63 |
IDT74FCT824C |
HIGH-PERFORMANCE CMOS BUS INTERFACE REGISTERS |
IDT |
64 |
IDT74FCT824CD |
HIGH-PERFORMANCE CMOS BUS INTERFACE REGISTERS |
IDT |
65 |
IDT74FCT824CDB |
HIGH-PERFORMANCE CMOS BUS INTERFACE REGISTERS |
IDT |
66 |
IDT74FCT824CE |
HIGH-PERFORMANCE CMOS BUS INTERFACE REGISTERS |
IDT |
67 |
IDT74FCT824CEB |
HIGH-PERFORMANCE CMOS BUS INTERFACE REGISTERS |
IDT |
68 |
IDT74FCT824CL |
HIGH-PERFORMANCE CMOS BUS INTERFACE REGISTERS |
IDT |
69 |
IDT74FCT824CLB |
HIGH-PERFORMANCE CMOS BUS INTERFACE REGISTERS |
IDT |
70 |
IDT74FCT824CP |
HIGH-PERFORMANCE CMOS BUS INTERFACE REGISTERS |
IDT |
71 |
IDT74FCT824CPB |
HIGH-PERFORMANCE CMOS BUS INTERFACE REGISTERS |
IDT |
72 |
IDT74FCT824CSO |
HIGH-PERFORMANCE CMOS BUS INTERFACE REGISTERS |
IDT |
73 |
IDT74FCT824CSOB |
HIGH-PERFORMANCE CMOS BUS INTERFACE REGISTERS |
IDT |
74 |
SN54BCT8240A |
Scan Test Devices With Octal Buffers |
Texas Instruments |
75 |
SN54BCT8240AFK |
SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS |
Texas Instruments |
76 |
SN54BCT8240AJT |
SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS |
Texas Instruments |
77 |
SN54BCT8244A |
Scan Test Devices With Octal Buffers |
Texas Instruments |
78 |
SN54BCT8244AFK |
SCAN TEST DEVICES WITH OCTAL BUFFERS |
Texas Instruments |
79 |
SN54BCT8244AJT |
SCAN TEST DEVICES WITH OCTAL BUFFERS |
Texas Instruments |
80 |
SN54BCT8245A |
Scan Test Devices With Octal Bus Transceivers |
Texas Instruments |
81 |
SN54BCT8245AJT |
SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS |
Texas Instruments |
82 |
SN54BCT8245ANT |
SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS |
Texas Instruments |
83 |
SN74BCT8240A |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Inverting Buffers |
Texas Instruments |
84 |
SN74BCT8240ADW |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Inverting Buffers |
Texas Instruments |
85 |
SN74BCT8240ADWR |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Inverting Buffers |
Texas Instruments |
86 |
SN74BCT8240ANT |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Inverting Buffers |
Texas Instruments |
87 |
SN74BCT8244A |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers |
Texas Instruments |
88 |
SN74BCT8244ADW |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers |
Texas Instruments |
89 |
SN74BCT8244ADWE4 |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers 24-SOIC 0 to 70 |
Texas Instruments |
90 |
SN74BCT8244ADWR |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers |
Texas Instruments |
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