| No. |
Part Name |
Description |
Manufacturer |
| 61 |
SN54BCT8373AFK |
SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES |
Texas Instruments |
| 62 |
SN54BCT8373AJT |
SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES |
Texas Instruments |
| 63 |
SN54BCT8374A |
Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops |
Texas Instruments |
| 64 |
SN54BCT8374AFK |
SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS |
Texas Instruments |
| 65 |
SN54BCT8374AJT |
SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS |
Texas Instruments |
| 66 |
SN74BCT8373 |
Scan Test Device With Octal D-Type Latches 24-PDIP 0 to 70 |
Texas Instruments |
| 67 |
SN74BCT8373A |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches |
Texas Instruments |
| 68 |
SN74BCT8373ADW |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches |
Texas Instruments |
| 69 |
SN74BCT8373ADWR |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches |
Texas Instruments |
| 70 |
SN74BCT8373ANT |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches |
Texas Instruments |
| 71 |
SN74BCT8373DW |
Scan Test Device With Octal D-Type Latches 24-SOIC 0 to 70 |
Texas Instruments |
| 72 |
SN74BCT8373DWR |
Scan Test Device With Octal D-Type Latches 24-SOIC 0 to 70 |
Texas Instruments |
| 73 |
SN74BCT8373NT |
Scan Test Device With Octal D-Type Latches 24-PDIP 0 to 70 |
Texas Instruments |
| 74 |
SN74BCT8374A |
Scan Test Device With Octal D-Type Edge-Triggered Flip-Flops |
Texas Instruments |
| 75 |
SN74BCT8374ADW |
Scan Test Device With Octal D-Type Edge-Triggered Flip-Flops |
Texas Instruments |
| 76 |
SN74BCT8374ADWR |
Scan Test Device With Octal D-Type Edge-Triggered Flip-Flops |
Texas Instruments |
| 77 |
SN74BCT8374ANT |
Scan Test Device With Octal D-Type Edge-Triggered Flip-Flops |
Texas Instruments |
| 78 |
SNJ54BCT8373AFK |
Scan Test Devices With Octal D-type Latches |
Texas Instruments |
| 79 |
SNJ54BCT8373AJT |
Scan Test Devices With Octal D-type Latches |
Texas Instruments |
| 80 |
SNJ54BCT8374AFK |
Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops |
Texas Instruments |
| 81 |
SNJ54BCT8374AJT |
Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops |
Texas Instruments |
| 82 |
TACT83000 |
AT CHIP SET |
Texas Instruments |
| 83 |
TACT83441 |
AT CHIP SET |
Texas Instruments |
| 84 |
TACT83441 |
AT CHIP SET |
Texas Instruments |
| 85 |
TACT83442 |
AT CHIP SET |
Texas Instruments |
| 86 |
TACT83443 |
AT CHIP SET |
Texas Instruments |
| | | |
