No. |
Part Name |
Description |
Manufacturer |
61 |
MNDS26F32MWR-QML |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
62 |
MNDS26F32MWRQMLV |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
63 |
MNLM136A |
2.5V REFERENCE DIODE, GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5 |
National Semiconductor |
64 |
MNLM136A-2.5-X |
2.5V REFERENCE DIODE, GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5 |
National Semiconductor |
65 |
MNLM136A-2.5-X-RH |
2.5V REFERENCE DIODE, GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5 |
National Semiconductor |
66 |
MNLMH6628-X-RH |
DUAL WIDEBAND, LOW-NOISE, VOLTAGE FEEDBACK OP AMP, GUARANTEED TO 300k rd (si) TESTED TO MIL-STD-883, METHOD 1019 |
National Semiconductor |
67 |
MRLM111 |
Total supply voltage: 36V; negative V.: -30V; positiveV: +30V; voltage comparator: also available guaranteed to 30k rd (Si) tested to MIL-STD-883, method 1019 |
National Semiconductor |
68 |
SP1450B(B) |
PCM Signal Monitor circuit, are screened to MIL-STD-883, Method 5004, Class B |
PLESSEY Semiconductors |
69 |
SP1455B(B) |
PCM Signal Monitor circuit, are screened to MIL-STD-883, Method 5004, Class B |
PLESSEY Semiconductors |
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