| No. |
Part Name |
Description |
Manufacturer |
| 61 |
SN74LVT8980AIDWREP |
Enhanced Product Embedded Test-Bus Controllers Ieee Std 1149.1 (Jtag) Tap Masters 24-SOIC -40 to 85 |
Texas Instruments |
| 62 |
SN74LVT8980DW |
EMBEDDED TEST-BUS CONTROLLERS IEEE STD 1149.1 (JTAG) TAP MASTERS WITH 8-BIT GENERIC HOST INTERFACES |
Texas Instruments |
| 63 |
SN74LVT8980DWR |
EMBEDDED TEST-BUS CONTROLLERS IEEE STD 1149.1 (JTAG) TAP MASTERS WITH 8-BIT GENERIC HOST INTERFACES |
Texas Instruments |
| 64 |
TEST-CIRCUITS |
Test circuits for Breakdown voltage and Drain-Source Current, Gate-Source Leakage Current, Drain-Source on-Resistance, etc. |
Samsung Electronic |
| 65 |
V62/03668-01XE |
Enhanced Product Embedded Test-Bus Controllers Ieee Std 1149.1 (Jtag) Tap Masters 24-SOIC -40 to 85 |
Texas Instruments |
| | | |
