| No. |
Part Name |
Description |
Manufacturer |
| 61 |
BCM94317 |
AirForce One™ Single-Chip 802.11b Transceiver Reference Design |
Broadcom |
| 62 |
BCM94317 |
AirForce One™ Single-Chip 802.11b Transceiver Reference Design |
Broadcom |
| 63 |
BCM94317 |
AirForce One™ Single-Chip 802.11b Transceiver Reference Design |
Broadcom |
| 64 |
BCM94318E |
AirForce One™ Single-Chip 802.11g Transceiver Reference Design with BroadRange™ Technology |
Broadcom |
| 65 |
BCM94702AP |
AIRFORCE WIRELESS AP/ROUTER |
Broadcom |
| 66 |
BCM94710AP |
AIRFORCE WIRELESS AP/ROUTER |
Broadcom |
| 67 |
EB4 HI TEMP |
High Temp (Glass Reinforced), Dual Readout, High Reliability Copper-Nickel-Tin Alloy Contacts or Gold Contacts, Recognized Under the Component Program of Underwriters' Laboratories Inc (File E65524) |
Vishay |
| 68 |
EB6 HI TEMP |
High Temp (Glass Reinforced), Dual Readout, High Reliability Copper-Nickel-Tin Alloy Contacts or Gold Contacts, Recognized Under the Component Program of Underwriters' Laboratories Inc (File E65524) |
Vishay |
| 69 |
EB7 HI TEMP |
High Temp (Glass Reinforced), Dual Readout, High Reliability Copper-Nickel-Tin Alloy Contacts or Gold Contacts, Recognized Under the Component Program of Underwriters' Laboratories Inc (File E65524) |
Vishay |
| 70 |
EB7D |
Dual Readout, Selective Gold Plating, Polarization Between Contact Positions, Polarizing Key is Reinforced Nylon, Protected Entry |
Vishay |
| 71 |
EB7S |
Single Readout, Selective Gold Plating, Polarization Between Contact Positions, Polarizing Key is Reinforced Nylon, Protected Entry |
Vishay |
| 72 |
EB8 HI TEMP |
High Temp (Glass Reinforced), Dual Readout, High Reliability Copper-Nickel-Tin Alloy Contacts or Gold Contacts, Recognized Under the Component Program of Underwriters' Laboratories Inc (File E65524) |
Vishay |
| 73 |
EBT156 |
Single Readout, Dip Solder, Eyelet and Wire Wrap Termination, Modified Tuning Fork Contacts, Polarization On or Between Contact Positions, Polarizing Key is Reinforced Nylon, Protected Entry |
Vishay |
| 74 |
EC10DA40 |
ELECTROSTATIC DISCHARGE REINFORCEMENT TYPE |
Nihon |
| 75 |
EP05DA40 |
ELECTROSTATIC DISCHARGE REINFORCEMENT TYPE |
Nihon |
| 76 |
FT6116 |
2K x 8 CMOS SRAM |
Force Technologies |
| 77 |
ISO5451 |
Reinforced Isolated IGBT Gate Driver with High CMTI & Miller Clamp 16-SOIC -40 to 125 |
Texas Instruments |
| 78 |
ISO5451DW |
Reinforced Isolated IGBT Gate Driver with High CMTI & Miller Clamp 16-SOIC -40 to 125 |
Texas Instruments |
| 79 |
ISO5451DWR |
Reinforced Isolated IGBT Gate Driver with High CMTI & Miller Clamp 16-SOIC -40 to 125 |
Texas Instruments |
| 80 |
ISO5851 |
Reinforced Isolated IGBT Gate Driver with High CMTI & Miller Clamp 16-SOIC -40 to 125 |
Texas Instruments |
| 81 |
ISO5851DW |
Reinforced Isolated IGBT Gate Driver with High CMTI & Miller Clamp 16-SOIC -40 to 125 |
Texas Instruments |
| 82 |
ISO5851DWR |
Reinforced Isolated IGBT Gate Driver with High CMTI & Miller Clamp 16-SOIC -40 to 125 |
Texas Instruments |
| 83 |
ISO5852S |
5.7 kVrms Split O/P, Reinforced Isolated IGBT Gate Driver 16-SOIC -40 to 125 |
Texas Instruments |
| 84 |
ISO5852SDW |
5.7 kVrms Split O/P, Reinforced Isolated IGBT Gate Driver 16-SOIC -40 to 125 |
Texas Instruments |
| 85 |
ISO5852SDWR |
5.7 kVrms Split O/P, Reinforced Isolated IGBT Gate Driver 16-SOIC -40 to 125 |
Texas Instruments |
| 86 |
ISO7810 |
High-Immunity, 5.7kVRMS Reinforced Single-Channel 1/0 Digital Isolator, 100Mbps 16-SOIC -55 to 125 |
Texas Instruments |
| 87 |
ISO7810DW |
High-Immunity, 5.7kVRMS Reinforced Single-Channel 1/0 Digital Isolator, 100Mbps 16-SOIC -55 to 125 |
Texas Instruments |
| 88 |
ISO7810DWR |
High-Immunity, 5.7kVRMS Reinforced Single-Channel 1/0 Digital Isolator, 100Mbps 16-SOIC -55 to 125 |
Texas Instruments |
| 89 |
ISO7810DWW |
High-Immunity, 5.7kVRMS Reinforced Single-Channel 1/0 Digital Isolator, 100Mbps 16-SOIC -55 to 125 |
Texas Instruments |
| 90 |
ISO7810DWWR |
High-Immunity, 5.7kVRMS Reinforced Single-Channel 1/0 Digital Isolator, 100Mbps 16-SOIC -55 to 125 |
Texas Instruments |
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