| No. |
Part Name |
Description |
Manufacturer |
| 61 |
SCAN921226H |
High Temperature 20MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access |
Texas Instruments |
| 62 |
SCAN921226HSM |
High Temperature 20MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access |
National Semiconductor |
| 63 |
SCAN921226HSM |
High Temperature 20MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 125 |
Texas Instruments |
| 64 |
SCAN921226HSM/NOPB |
High Temperature 20MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 125 |
Texas Instruments |
| 65 |
SCAN921226HSMX |
High Temperature 20MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access |
National Semiconductor |
| 66 |
SCAN921226SLC |
30MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access |
National Semiconductor |
| 67 |
SCAN921226SLCX |
30MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access |
National Semiconductor |
| 68 |
SCANSTA101 |
Low Voltage IEEE 1149.1 System Test Access (STA) Master |
Texas Instruments |
| 69 |
SCANSTA101SM |
Low Voltage IEEE 1149.1 System Test Access (STA) Master 49-NFBGA -40 to 85 |
Texas Instruments |
| 70 |
SCANSTA101SM/NOPB |
Low Voltage IEEE 1149.1 System Test Access (STA) Master 49-NFBGA -40 to 85 |
Texas Instruments |
| 71 |
SCANSTA101SMX |
Low Voltage IEEE 1149.1 System Test Access (STA) Master 49-NFBGA -40 to 85 |
Texas Instruments |
| 72 |
SCANSTA101SMX/NOPB |
Low Voltage IEEE 1149.1 System Test Access (STA) Master 49-NFBGA -40 to 85 |
Texas Instruments |
| 73 |
STA400EP |
STA400EP IEEE 1149.4 Analog Test Access Device |
National Semiconductor |
| 74 |
STA400MTEP |
STA400EP IEEE 1149.4 Analog Test Access Device |
National Semiconductor |
| 75 |
TS83102G0BMGS |
This latest A/D converter is a thermally enhanced, pin-to-pin compatible version of the high-speed TS83102G0B ADC and is designed ... |
Atmel |
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