| No. |
Part Name |
Description |
Manufacturer |
| 6511 |
SN54LS183J |
Dual Carry-Save full adder |
Motorola |
| 6512 |
SN55451B |
Dual Very-High Speed, High-Current Peripheral Drivers |
Texas Instruments |
| 6513 |
SN55451BJG |
Dual Very-High Speed, High-Current Peripheral Drivers |
Texas Instruments |
| 6514 |
SN55452B |
Dual Very-High Speed, High-Current Peripheral Drivers |
Texas Instruments |
| 6515 |
SN55452BJG |
Dual Very-High Speed, High-Current Peripheral Drivers |
Texas Instruments |
| 6516 |
SN55453B |
Dual Very-High Speed, High-Current Peripheral Drivers |
Texas Instruments |
| 6517 |
SN55453BJG |
Dual Very-High Speed, High-Current Peripheral Drivers |
Texas Instruments |
| 6518 |
SN55454B |
Dual Very-High Speed, High-Current Peripheral Drivers |
Texas Instruments |
| 6519 |
SN55454BJG |
Dual Very-High Speed, High-Current Peripheral Drivers |
Texas Instruments |
| 6520 |
SN74265 |
Quadruple Complementary-Output Elements 16-PDIP 0 to 70 |
Texas Instruments |
| 6521 |
SN74265N |
Quadruple Complementary-Output Elements 16-PDIP 0 to 70 |
Texas Instruments |
| 6522 |
SN74265N3 |
Quadruple Complementary-Output Elements 16-PDIP 0 to 70 |
Texas Instruments |
| 6523 |
SN74285 |
QUADRUPLE COMPLEMENTARY-OUTPUT ELEMENTS |
Texas Instruments |
| 6524 |
SN74285N |
QUADRUPLE COMPLEMENTARY-OUTPUT ELEMENTS |
Texas Instruments |
| 6525 |
SN74BCT8240A |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Inverting Buffers |
Texas Instruments |
| 6526 |
SN74BCT8240ADW |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Inverting Buffers |
Texas Instruments |
| 6527 |
SN74BCT8240ADWR |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Inverting Buffers |
Texas Instruments |
| 6528 |
SN74BCT8240ANT |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Inverting Buffers |
Texas Instruments |
| 6529 |
SN74BCT8244A |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers |
Texas Instruments |
| 6530 |
SN74BCT8244ADW |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers |
Texas Instruments |
| 6531 |
SN74BCT8244ADWE4 |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers 24-SOIC 0 to 70 |
Texas Instruments |
| 6532 |
SN74BCT8244ADWR |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers |
Texas Instruments |
| 6533 |
SN74BCT8244ANT |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers |
Texas Instruments |
| 6534 |
SN74BCT8245A |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Bus Transceivers |
Texas Instruments |
| 6535 |
SN74BCT8245ADW |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Bus Transceivers |
Texas Instruments |
| 6536 |
SN74BCT8245ADWR |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Bus Transceivers |
Texas Instruments |
| 6537 |
SN74BCT8245ANT |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Bus Transceivers |
Texas Instruments |
| 6538 |
SN74BCT8373A |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches |
Texas Instruments |
| 6539 |
SN74BCT8373ADW |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches |
Texas Instruments |
| 6540 |
SN74BCT8373ADWR |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches |
Texas Instruments |
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