No. |
Part Name |
Description |
Manufacturer |
661 |
BM1R00150F-E2 |
High Efficiency and Low Standby Power, CCM corresponding Secondary Side Synchronous Rectification Controller IC |
ROHM |
662 |
BU9929FV |
I2C BUS interface, general purpose I/O ports with condition watching function |
ROHM |
663 |
CS & P |
High Value Single Resistor for Wire Bonding and Solder Reflow |
Vishay |
664 |
D...-CRCW |
Metal Glaze on High Quality Ceramic, Protective Over Glaze, SnPb Contacts on Ni Barrier Layer, Excellent Stability at Different Environmental Conditions, Suitable for Commercial and Special Applications |
Vishay |
665 |
D..P/CRCW |
Metal Glaze on High Quality Ceramic, Protective Over Glaze, SnPb Contacts on Ni Barrier Layer, Excellent Stability at Different Environmental Conditions |
Vishay |
666 |
DFM14 |
Military, MIL-R-83401 Qualified, Type RZ, 11, 12, 15 Schematics, Hot Solder Dip, Highly Stable, Passes MIL-STD-202 Method 210, Condition E ""Resistance to Soldering Heat"" Test |
Vishay |
667 |
DFP14 |
Military, Hot Solder Dip or Gold Plated Leads, Highly Stable, Passes MIL-STD-202 Method 210, Condition E ""Resistance to Soldering Heat"" Test |
Vishay |
668 |
DFP16 |
Military, Hot Solder Dip or Gold Plated Leads, Highly Stable, Passes MIL-STD-202 Method 210, Condition E ""Resistance to Soldering Heat"" Test |
Vishay |
669 |
DPM40 |
A compact Low-Cost LED Module ideally suited for applications where a Bright Display Under All Conditions is Required |
etc |
670 |
DRV401 |
Sensor Signal Conditioning for Closed-Loop Magnetic Current Sensor |
Texas Instruments |
671 |
DRV401-EP |
Enhanced Product Sensor Signal Conditioning for Closed-Loop Magnetic Current Sensor |
Texas Instruments |
672 |
DRV401AIDWP |
Sensor Signal Conditioning IC for Closed-Loop Fluxgate Sensor Applications 20-SO PowerPAD -40 to 125 |
Texas Instruments |
673 |
DRV401AIDWPG4 |
Sensor Signal Conditioning IC for Closed-Loop Fluxgate Sensor Applications 20-SO PowerPAD -40 to 125 |
Texas Instruments |
674 |
DRV401AIDWPR |
Sensor Signal Conditioning IC for Closed-Loop Fluxgate Sensor Applications 20-SO PowerPAD -40 to 125 |
Texas Instruments |
675 |
DRV401AIDWPRG4 |
Sensor Signal Conditioning IC for Closed-Loop Fluxgate Sensor Applications 20-SO PowerPAD -40 to 125 |
Texas Instruments |
676 |
DRV401AIRGWR |
Sensor Signal Conditioning IC for Closed-Loop Fluxgate Sensor Applications 20-VQFN -40 to 125 |
Texas Instruments |
677 |
DRV401AIRGWRG4 |
Sensor Signal Conditioning IC for Closed-Loop Fluxgate Sensor Applications 20-VQFN -40 to 125 |
Texas Instruments |
678 |
DRV401AIRGWT |
Sensor Signal Conditioning IC for Closed-Loop Fluxgate Sensor Applications 20-VQFN -40 to 125 |
Texas Instruments |
679 |
DRV401AIRGWTG4 |
Sensor Signal Conditioning IC for Closed-Loop Fluxgate Sensor Applications 20-VQFN -40 to 125 |
Texas Instruments |
680 |
DRV401AMDWPREP |
Enhanced Product Sensor Signal Conditioning for Closed-Loop Magnetic Current Sensor 20-SO PowerPAD -55 to 125 |
Texas Instruments |
681 |
DRV411 |
Sensor Signal Conditioning IC for Closed-Loop Magnetic Current Sensors |
Texas Instruments |
682 |
DRV411AIPWP |
Sensor Signal Conditioning IC for Closed-Loop Hall-Effect Sensor Applications 20-HTSSOP -40 to 125 |
Texas Instruments |
683 |
DRV411AIPWPR |
Sensor Signal Conditioning IC for Closed-Loop Hall-Effect Sensor Applications 20-HTSSOP -40 to 125 |
Texas Instruments |
684 |
DRV411AIRGPR |
Sensor Signal Conditioning IC for Closed-Loop Hall-Effect Sensor Applications 20-QFN -40 to 125 |
Texas Instruments |
685 |
DRV411AIRGPT |
Sensor Signal Conditioning IC for Closed-Loop Hall-Effect Sensor Applications 20-QFN -40 to 125 |
Texas Instruments |
686 |
DS26F32ME/883 |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
687 |
DS26F32MER-QML |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
688 |
DS26F32MJ-QMLV |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
689 |
DS26F32MJR-QML |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
690 |
DS26F32MJRQMLV |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
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