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Datasheets for ACC

Datasheets found :: 8670
Page: | 230 | 231 | 232 | 233 | 234 | 235 | 236 | 237 | 238 |
No. Part Name Description Manufacturer
6991 SCAN921025HSMX/NOPB High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 125 Texas Instruments
6992 SCAN921025SLC 30MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access National Semiconductor
6993 SCAN921025SLCX 30MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access National Semiconductor
6994 SCAN921224 20 MHz-66MHz 10-Bit Deserializer with IEEE 1149.1 Test Access Texas Instruments
6995 SCAN921224SLC 20 MHz-66MHz 10-Bit Deserializer with IEEE 1149.1 Test Access National Semiconductor
6996 SCAN921224SLC 20 MHz-66MHz 10-Bit Deserializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 85 Texas Instruments
6997 SCAN921224SLC/NOPB 20 MHz-66MHz 10-Bit Deserializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 85 Texas Instruments
6998 SCAN921224SLCX 20 MHz-66MHz 10-Bit Deserializer with IEEE 1149.1 Test Access National Semiconductor
6999 SCAN921226H High Temperature 20MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access National Semiconductor
7000 SCAN921226H High Temperature 20MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access Texas Instruments
7001 SCAN921226HSM High Temperature 20MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access National Semiconductor
7002 SCAN921226HSM High Temperature 20MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 125 Texas Instruments
7003 SCAN921226HSM/NOPB High Temperature 20MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 125 Texas Instruments
7004 SCAN921226HSMX High Temperature 20MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access National Semiconductor
7005 SCAN921226SLC 30MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access National Semiconductor
7006 SCAN921226SLCX 30MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access National Semiconductor
7007 SCANSTA101 Low Voltage IEEE 1149.1 System Test Access (STA) Master Texas Instruments
7008 SCANSTA101SM Low Voltage IEEE 1149.1 System Test Access (STA) Master 49-NFBGA -40 to 85 Texas Instruments
7009 SCANSTA101SM/NOPB Low Voltage IEEE 1149.1 System Test Access (STA) Master 49-NFBGA -40 to 85 Texas Instruments
7010 SCANSTA101SMX Low Voltage IEEE 1149.1 System Test Access (STA) Master 49-NFBGA -40 to 85 Texas Instruments
7011 SCANSTA101SMX/NOPB Low Voltage IEEE 1149.1 System Test Access (STA) Master 49-NFBGA -40 to 85 Texas Instruments
7012 SCM6341ZP10A 128K x 24 Bit Static Random Access Memory Motorola
7013 SCM6341ZP12A 128K x 24 Bit Static Random Access Memory Motorola
7014 SCM6341ZP15A 128K x 24 Bit Static Random Access Memory Motorola
7015 SDA9251-2X 868352-Bit Dynamic Sequential Access ... Infineon
7016 SDA9251-2XGEG 868352-Bit Dynamic Sequential Access ... Infineon
7017 SDA9253 2.6Mbit Dynamic Sequential Access Mem... Infineon
7018 SDA9253GEG 2.6Mbit Dynamic Sequential Access Mem... Infineon
7019 SE95 Ultra high accuracy digital temperature sensor and thermal Watchdog(tm) Philips
7020 SE95D Ultra high accuracy digital temperature sensor and thermal watchdog NXP Semiconductors


Datasheets found :: 8670
Page: | 230 | 231 | 232 | 233 | 234 | 235 | 236 | 237 | 238 |



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