| No. |
Part Name |
Description |
Manufacturer |
| 7441 |
SLU304VR-2 |
800/700mW High Power Laser Diode with a Detachable Fiber, wavelength 810±10 nm |
SONY |
| 7442 |
SLU304VR-21 |
800/700mW High Power Laser Diode with a Detachable Fiber, wavelength 798±3 nm |
SONY |
| 7443 |
SLU304VR-24 |
800/700mW High Power Laser Diode with a Detachable Fiber, wavelength 807±3 nm |
SONY |
| 7444 |
SLU304VR-25 |
800/700mW High Power Laser Diode with a Detachable Fiber, wavelength 810±3 nm |
SONY |
| 7445 |
SLU304VR-3 |
800/700mW High Power Laser Diode with a Detachable Fiber, wavelength 830±10 nm |
SONY |
| 7446 |
SLU304XR |
800/700mW High Power Laser Diode with a Detachable Fiber |
SONY |
| 7447 |
SLU304XR-1 |
800/700mW High Power Laser Diode with a Detachable Fiber, wavelength 785±15 nm |
SONY |
| 7448 |
SLU304XR-2 |
800/700mW High Power Laser Diode with a Detachable Fiber, wavelength 810±10 nm |
SONY |
| 7449 |
SLU304XR-21 |
800/700mW High Power Laser Diode with a Detachable Fiber, wavelength 798±3 nm |
SONY |
| 7450 |
SLU304XR-24 |
800/700mW High Power Laser Diode with a Detachable Fiber, wavelength 807±3 nm |
SONY |
| 7451 |
SLU304XR-25 |
800/700mW High Power Laser Diode with a Detachable Fiber, wavelength 810±3 nm |
SONY |
| 7452 |
SLU304XR-3 |
800/700mW High Power Laser Diode with a Detachable Fiber, wavelength 830±10 nm |
SONY |
| 7453 |
SMP1307-099 |
PIN Diode Chips Supplied on Film Frame with thick I-layers designed for low-distortion RF variable attenuator applications |
Skyworks Solutions |
| 7454 |
SN5401 |
Quadruple 2 Input Positive NAND Gate with Open Collector Output |
Transitron Electronic |
| 7455 |
SN5403 |
Quadruple 2 Input Positive NAND Gate with Open Collector Output |
Transitron Electronic |
| 7456 |
SN54ABT18502 |
Scan Test Device With 18-Bit Registered Bus Transceiver |
Texas Instruments |
| 7457 |
SN54ABT18502HV |
SCAN TEST DEVICE WITH 18-BIT REGISTERED BUS TRANSCEIVER |
Texas Instruments |
| 7458 |
SN54ABT18646HV |
SCAN TEST DEVICE WITH 18-BIT TRANSCEIVERS AND REGISTERS |
Texas Instruments |
| 7459 |
SN54LS670 |
4 x 4 REGISTER FILE WITH 3-STATE OUTPUTS |
Motorola |
| 7460 |
SN54LS670J |
4 x 4 REGISTER FILE WITH 3-STATE OUTPUTS |
Motorola |
| 7461 |
SN54LVT18502 |
3.3-V ABT SCAN TEST DEVICE WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS |
Texas Instruments |
| 7462 |
SN54LVT18502HV |
3.3-V ABT SCAN TEST DEVICE WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS |
Texas Instruments |
| 7463 |
SN6401 |
Quadruple 2 Input Positive NAND Gate with Open Collector Output |
Transitron Electronic |
| 7464 |
SN6403 |
Quadruple 2 Input Positive NAND Gate with Open Collector Output |
Transitron Electronic |
| 7465 |
SN64BCT125A |
Quadruple Bus Buffer Gate With 3-State Outputs |
Texas Instruments |
| 7466 |
SN64BCT125AD |
Quadruple Bus Buffer Gate With 3-State Outputs |
Texas Instruments |
| 7467 |
SN64BCT125ADR |
Quadruple Bus Buffer Gate With 3-State Outputs |
Texas Instruments |
| 7468 |
SN64BCT125AN |
Quadruple Bus Buffer Gate With 3-State Outputs |
Texas Instruments |
| 7469 |
SN64BCT125ANSR |
Quadruple Bus Buffer Gate With 3-State Outputs |
Texas Instruments |
| 7470 |
SN64BCT126A |
Quadruple Bus Buffer Gate With 3-State Outputs |
Texas Instruments |
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