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Datasheets for ACC

Datasheets found :: 11105
Page: | 265 | 266 | 267 | 268 | 269 | 270 | 271 | 272 | 273 |
No. Part Name Description Manufacturer
8041 SCAN921025HSM High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 125 Texas Instruments
8042 SCAN921025HSM/NOPB High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 125 Texas Instruments
8043 SCAN921025HSMX High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access National Semiconductor
8044 SCAN921025HSMX/NOPB High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 125 Texas Instruments
8045 SCAN921025SLC 30MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access National Semiconductor
8046 SCAN921025SLCX 30MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access National Semiconductor
8047 SCAN921224 20 MHz-66MHz 10-Bit Deserializer with IEEE 1149.1 Test Access Texas Instruments
8048 SCAN921224SLC 20 MHz-66MHz 10-Bit Deserializer with IEEE 1149.1 Test Access National Semiconductor
8049 SCAN921224SLC 20 MHz-66MHz 10-Bit Deserializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 85 Texas Instruments
8050 SCAN921224SLC/NOPB 20 MHz-66MHz 10-Bit Deserializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 85 Texas Instruments
8051 SCAN921224SLCX 20 MHz-66MHz 10-Bit Deserializer with IEEE 1149.1 Test Access National Semiconductor
8052 SCAN921226H High Temperature 20MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access National Semiconductor
8053 SCAN921226H High Temperature 20MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access Texas Instruments
8054 SCAN921226HSM High Temperature 20MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access National Semiconductor
8055 SCAN921226HSM High Temperature 20MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 125 Texas Instruments
8056 SCAN921226HSM/NOPB High Temperature 20MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 125 Texas Instruments
8057 SCAN921226HSMX High Temperature 20MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access National Semiconductor
8058 SCAN921226SLC 30MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access National Semiconductor
8059 SCAN921226SLCX 30MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access National Semiconductor
8060 SCANSTA101 Low Voltage IEEE 1149.1 System Test Access (STA) Master Texas Instruments
8061 SCANSTA101SM Low Voltage IEEE 1149.1 System Test Access (STA) Master 49-NFBGA -40 to 85 Texas Instruments
8062 SCANSTA101SM/NOPB Low Voltage IEEE 1149.1 System Test Access (STA) Master 49-NFBGA -40 to 85 Texas Instruments
8063 SCANSTA101SMX Low Voltage IEEE 1149.1 System Test Access (STA) Master 49-NFBGA -40 to 85 Texas Instruments
8064 SCANSTA101SMX/NOPB Low Voltage IEEE 1149.1 System Test Access (STA) Master 49-NFBGA -40 to 85 Texas Instruments
8065 SCM6341ZP10A 128K x 24 Bit Static Random Access Memory Motorola
8066 SCM6341ZP12A 128K x 24 Bit Static Random Access Memory Motorola
8067 SCM6341ZP15A 128K x 24 Bit Static Random Access Memory Motorola
8068 SDA9251-2X 868352-Bit Dynamic Sequential Access ... Infineon
8069 SDA9251-2XGEG 868352-Bit Dynamic Sequential Access ... Infineon
8070 SDA9253 2.6Mbit Dynamic Sequential Access Mem... Infineon


Datasheets found :: 11105
Page: | 265 | 266 | 267 | 268 | 269 | 270 | 271 | 272 | 273 |



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