No. |
Part Name |
Description |
Manufacturer |
8041 |
SCAN921025HSM |
High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 125 |
Texas Instruments |
8042 |
SCAN921025HSM/NOPB |
High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 125 |
Texas Instruments |
8043 |
SCAN921025HSMX |
High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access |
National Semiconductor |
8044 |
SCAN921025HSMX/NOPB |
High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 125 |
Texas Instruments |
8045 |
SCAN921025SLC |
30MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access |
National Semiconductor |
8046 |
SCAN921025SLCX |
30MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access |
National Semiconductor |
8047 |
SCAN921224 |
20 MHz-66MHz 10-Bit Deserializer with IEEE 1149.1 Test Access |
Texas Instruments |
8048 |
SCAN921224SLC |
20 MHz-66MHz 10-Bit Deserializer with IEEE 1149.1 Test Access |
National Semiconductor |
8049 |
SCAN921224SLC |
20 MHz-66MHz 10-Bit Deserializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 85 |
Texas Instruments |
8050 |
SCAN921224SLC/NOPB |
20 MHz-66MHz 10-Bit Deserializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 85 |
Texas Instruments |
8051 |
SCAN921224SLCX |
20 MHz-66MHz 10-Bit Deserializer with IEEE 1149.1 Test Access |
National Semiconductor |
8052 |
SCAN921226H |
High Temperature 20MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access |
National Semiconductor |
8053 |
SCAN921226H |
High Temperature 20MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access |
Texas Instruments |
8054 |
SCAN921226HSM |
High Temperature 20MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access |
National Semiconductor |
8055 |
SCAN921226HSM |
High Temperature 20MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 125 |
Texas Instruments |
8056 |
SCAN921226HSM/NOPB |
High Temperature 20MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 125 |
Texas Instruments |
8057 |
SCAN921226HSMX |
High Temperature 20MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access |
National Semiconductor |
8058 |
SCAN921226SLC |
30MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access |
National Semiconductor |
8059 |
SCAN921226SLCX |
30MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access |
National Semiconductor |
8060 |
SCANSTA101 |
Low Voltage IEEE 1149.1 System Test Access (STA) Master |
Texas Instruments |
8061 |
SCANSTA101SM |
Low Voltage IEEE 1149.1 System Test Access (STA) Master 49-NFBGA -40 to 85 |
Texas Instruments |
8062 |
SCANSTA101SM/NOPB |
Low Voltage IEEE 1149.1 System Test Access (STA) Master 49-NFBGA -40 to 85 |
Texas Instruments |
8063 |
SCANSTA101SMX |
Low Voltage IEEE 1149.1 System Test Access (STA) Master 49-NFBGA -40 to 85 |
Texas Instruments |
8064 |
SCANSTA101SMX/NOPB |
Low Voltage IEEE 1149.1 System Test Access (STA) Master 49-NFBGA -40 to 85 |
Texas Instruments |
8065 |
SCM6341ZP10A |
128K x 24 Bit Static Random Access Memory |
Motorola |
8066 |
SCM6341ZP12A |
128K x 24 Bit Static Random Access Memory |
Motorola |
8067 |
SCM6341ZP15A |
128K x 24 Bit Static Random Access Memory |
Motorola |
8068 |
SDA9251-2X |
868352-Bit Dynamic Sequential Access ... |
Infineon |
8069 |
SDA9251-2XGEG |
868352-Bit Dynamic Sequential Access ... |
Infineon |
8070 |
SDA9253 |
2.6Mbit Dynamic Sequential Access Mem... |
Infineon |
| | | |