| No. |
Part Name |
Description |
Manufacturer |
| 811 |
AS91L1006U-10L100-IF |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
| 812 |
AS91L1006U-10L100-IG |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
| 813 |
AS91L1006U-40L100-C |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
| 814 |
AS91L1006U-40L100-CF |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
| 815 |
AS91L1006U-40L100-CG |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
| 816 |
AS91L1006U-40L100-I |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
| 817 |
AS91L1006U-40L100-IF |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
| 818 |
AS91L1006U-40L100-IG |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
| 819 |
ASG100 |
Audio Test Generator |
Tektronix |
| 820 |
ASG140 |
Audio Test Generator |
Tektronix |
| 821 |
BCM1500TRP |
CALISTO™ Test and Reference Platform |
Broadcom |
| 822 |
CBL-2FT-NMNM |
Coaxial-Flex Test Cables 50 DC to 18 GHz |
Mini-Circuits |
| 823 |
CBL-2FT-SMNM |
Coaxial-Flex Test Cables 50 DC to 18 GHz |
Mini-Circuits |
| 824 |
CBL-2FT-SMSM |
Coaxial-Flex Test Cables 50 DC to 18 GHz |
Mini-Circuits |
| 825 |
CBL-3FT-NMNM |
Coaxial-Flex Test Cables 50 DC to 18 GHz |
Mini-Circuits |
| 826 |
CBL-3FT-SMNM |
Coaxial-Flex Test Cables 50 DC to 18 GHz |
Mini-Circuits |
| 827 |
CBL-3FT-SMSM |
Coaxial-Flex Test Cables 50 DC to 18 GHz |
Mini-Circuits |
| 828 |
CBL-6FT-NMNM |
Coaxial-Flex Test Cables 50 DC to 18 GHz |
Mini-Circuits |
| 829 |
CBL-6FT-SMNM |
Coaxial-Flex Test Cables 50 DC to 18 GHz |
Mini-Circuits |
| 830 |
CBL-6FT-SMSM |
Coaxial-Flex Test Cables 50 DC to 18 GHz |
Mini-Circuits |
| 831 |
CBL-SERIES |
Coaxial-Flex Test Cables 50 DC to 18 GHz |
Mini-Circuits |
| 832 |
CIRCULATORS |
General informations, Terms and definitions, standard test specifications |
Philips |
| 833 |
CS4373 |
Low-Power, High-Performance Delta-Sigma Test DAC |
Cirrus Logic |
| 834 |
CS4373 |
Low-Power, High-Performance Delta-Sigma Test DAC |
Cirrus Logic |
| 835 |
DTS-1600A |
Dielectric Test System |
Directed Energy |
| 836 |
DTS-1600A |
Dielectric test system |
IXYS |
| 837 |
E2922B |
133 MHz PCI-X Master Target Test Card |
Agilent (Hewlett-Packard) |
| 838 |
E2955A |
InfiniBand 4x Test Bundle |
Agilent (Hewlett-Packard) |
| 839 |
E2969A |
Protocol Test Card for PCI Express |
Agilent (Hewlett-Packard) |
| 840 |
FAN54040 |
USB-OTG, 1.55A, Li-Ion Switching Chargers with Power Path and 2.3A Production Test Support |
Fairchild Semiconductor |
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