| No. |
Part Name |
Description |
Manufacturer |
| 8911 |
SN74BCT760MDWREP |
Enhanced Product Octal Buffer/Driver With Open-Collector Outputs 20-SOIC -55 to 125 |
Texas Instruments |
| 8912 |
SN74BCT760N |
Octal Buffers/Drivers With Open-Collector Outputs |
Texas Instruments |
| 8913 |
SN74BCT760NSR |
Octal Buffers/Drivers With Open-Collector Outputs |
Texas Instruments |
| 8914 |
SN74BCT8240A |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Inverting Buffers |
Texas Instruments |
| 8915 |
SN74BCT8240ADW |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Inverting Buffers |
Texas Instruments |
| 8916 |
SN74BCT8240ADWR |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Inverting Buffers |
Texas Instruments |
| 8917 |
SN74BCT8240ANT |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Inverting Buffers |
Texas Instruments |
| 8918 |
SN74BCT8244A |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers |
Texas Instruments |
| 8919 |
SN74BCT8244ADW |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers |
Texas Instruments |
| 8920 |
SN74BCT8244ADWE4 |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers 24-SOIC 0 to 70 |
Texas Instruments |
| 8921 |
SN74BCT8244ADWR |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers |
Texas Instruments |
| 8922 |
SN74BCT8244ANT |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers |
Texas Instruments |
| 8923 |
SN74BCT8245A |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Bus Transceivers |
Texas Instruments |
| 8924 |
SN74BCT8245ADW |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Bus Transceivers |
Texas Instruments |
| 8925 |
SN74BCT8245ADWR |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Bus Transceivers |
Texas Instruments |
| 8926 |
SN74BCT8245AFK |
SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS |
Texas Instruments |
| 8927 |
SN74BCT8245ANT |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Bus Transceivers |
Texas Instruments |
| 8928 |
SN74BCT8373 |
Scan Test Device With Octal D-Type Latches 24-PDIP 0 to 70 |
Texas Instruments |
| 8929 |
SN74BCT8373A |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches |
Texas Instruments |
| 8930 |
SN74BCT8373ADW |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches |
Texas Instruments |
| 8931 |
SN74BCT8373ADWR |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches |
Texas Instruments |
| 8932 |
SN74BCT8373ANT |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches |
Texas Instruments |
| 8933 |
SN74BCT8373DW |
Scan Test Device With Octal D-Type Latches 24-SOIC 0 to 70 |
Texas Instruments |
| 8934 |
SN74BCT8373DWR |
Scan Test Device With Octal D-Type Latches 24-SOIC 0 to 70 |
Texas Instruments |
| 8935 |
SN74BCT8373NT |
Scan Test Device With Octal D-Type Latches 24-PDIP 0 to 70 |
Texas Instruments |
| 8936 |
SN74BCT8374A |
Scan Test Device With Octal D-Type Edge-Triggered Flip-Flops |
Texas Instruments |
| 8937 |
SN74BCT8374ADW |
Scan Test Device With Octal D-Type Edge-Triggered Flip-Flops |
Texas Instruments |
| 8938 |
SN74BCT8374ADWR |
Scan Test Device With Octal D-Type Edge-Triggered Flip-Flops |
Texas Instruments |
| 8939 |
SN74BCT8374ANT |
Scan Test Device With Octal D-Type Edge-Triggered Flip-Flops |
Texas Instruments |
| 8940 |
SN74BCT899 |
9-Bit Latchable Transceivers With Parity Generator/Checker 28-SOIC 0 to 70 |
Texas Instruments |
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