No. |
Part Name |
Description |
Manufacturer |
91 |
NJM2122D |
ULTRA LOW NOISE DUAL OPERATIONAL AMPLIFIER |
New Japan Radio |
92 |
NJM2122M |
ULTRA LOW NOISE DUAL OPERATIONAL AMPLIFIER |
New Japan Radio |
93 |
Q62702-C2122 |
NPN Silicon AF Transistors (For AF driver and output stages High collector current) |
Siemens |
94 |
R6021222 |
Fast Recovery Rectifier (220Amperes Average 1600 Volts) |
Powerex Power Semiconductors |
95 |
R6021222PSYA |
1200V, 220A fast recovery single diode |
Powerex Power Semiconductors |
96 |
R6021225 |
Fast Recovery Rectifier (250 Amperes Average 1600 Volts) |
Powerex Power Semiconductors |
97 |
R6021225HSYA |
1200V, 250A fast recovery single diode |
Powerex Power Semiconductors |
98 |
RCM2122R |
16 character 1 line COG module |
ROHM |
99 |
RCM2122R-A/B |
LCD Displays > COG Module (Customized and General Purpose) |
ROHM |
100 |
SCAN921224 |
20-66 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST |
National Semiconductor |
101 |
SCAN921224 |
20 MHz-66MHz 10-Bit Deserializer with IEEE 1149.1 Test Access |
Texas Instruments |
102 |
SCAN921224SLC |
20 MHz-66MHz 10-Bit Deserializer with IEEE 1149.1 Test Access |
National Semiconductor |
103 |
SCAN921224SLC |
20 MHz-66MHz 10-Bit Deserializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 85 |
Texas Instruments |
104 |
SCAN921224SLC/NOPB |
20 MHz-66MHz 10-Bit Deserializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 85 |
Texas Instruments |
105 |
SCAN921224SLCX |
20 MHz-66MHz 10-Bit Deserializer with IEEE 1149.1 Test Access |
National Semiconductor |
106 |
SCAN921226 |
30-80 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST |
National Semiconductor |
107 |
SCAN921226 |
30-80 MHz 10 Bit Bus LVDS Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST 49-NFBGA |
Texas Instruments |
108 |
SCAN921226H |
High Temperature 20MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access |
National Semiconductor |
109 |
SCAN921226H |
High Temperature 20MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access |
Texas Instruments |
110 |
SCAN921226HSM |
High Temperature 20MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access |
National Semiconductor |
111 |
SCAN921226HSM |
High Temperature 20MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 125 |
Texas Instruments |
112 |
SCAN921226HSM/NOPB |
High Temperature 20MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 125 |
Texas Instruments |
113 |
SCAN921226HSMX |
High Temperature 20MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access |
National Semiconductor |
114 |
SCAN921226SLC |
30MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access |
National Semiconductor |
115 |
SCAN921226SLC/NOPB |
30-80 MHz 10 Bit Bus LVDS Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST 49-NFBGA |
Texas Instruments |
116 |
SCAN921226SLCX |
30MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access |
National Semiconductor |
117 |
SSM-2122 |
Dynamic Range Processor/Dual VCA |
Precision Monolithics |
118 |
SSM2122 |
Dynamic Range Processor/Dual VCA |
Analog Devices |
119 |
SSM2122 |
Dynamic Range Processor/Dual VCA |
Precision Monolithics |
120 |
SSM2122P |
Dynamic Range Processor/Dual VCA |
Precision Monolithics |
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