No. |
Part Name |
Description |
Manufacturer |
91 |
SN54BCT8245ANT |
SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS |
Texas Instruments |
92 |
SN74ABT8245 |
Scan Test Devices With Octal Bus Transceivers |
Texas Instruments |
93 |
SN74ABT8245DW |
Scan Test Devices With Octal Bus Transceivers |
Texas Instruments |
94 |
SN74ABT8245DWG4 |
Scan Test Devices With Octal Bus Transceivers 24-SOIC -40 to 85 |
Texas Instruments |
95 |
SN74ABT8245DWR |
Scan Test Devices With Octal Bus Transceivers |
Texas Instruments |
96 |
SN74BCT8240A |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Inverting Buffers |
Texas Instruments |
97 |
SN74BCT8240ADW |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Inverting Buffers |
Texas Instruments |
98 |
SN74BCT8240ADWR |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Inverting Buffers |
Texas Instruments |
99 |
SN74BCT8240ANT |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Inverting Buffers |
Texas Instruments |
100 |
SN74BCT8244A |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers |
Texas Instruments |
101 |
SN74BCT8244ADW |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers |
Texas Instruments |
102 |
SN74BCT8244ADWE4 |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers 24-SOIC 0 to 70 |
Texas Instruments |
103 |
SN74BCT8244ADWR |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers |
Texas Instruments |
104 |
SN74BCT8244ANT |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers |
Texas Instruments |
105 |
SN74BCT8245A |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Bus Transceivers |
Texas Instruments |
106 |
SN74BCT8245ADW |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Bus Transceivers |
Texas Instruments |
107 |
SN74BCT8245ADWR |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Bus Transceivers |
Texas Instruments |
108 |
SN74BCT8245AFK |
SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS |
Texas Instruments |
109 |
SN74BCT8245ANT |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Bus Transceivers |
Texas Instruments |
110 |
SNJ54ABT8245FK |
Scan Test Devices With Octal Bus Transceivers |
Texas Instruments |
111 |
SNJ54ABT8245JT |
Scan Test Devices With Octal Bus Transceivers |
Texas Instruments |
112 |
SNJ54BCT8240AFK |
Scan Test Devices With Octal Buffers |
Texas Instruments |
113 |
SNJ54BCT8240AJT |
Scan Test Devices With Octal Buffers |
Texas Instruments |
114 |
SNJ54BCT8244AFK |
Scan Test Devices With Octal Buffers |
Texas Instruments |
115 |
SNJ54BCT8244AJT |
Scan Test Devices With Octal Buffers |
Texas Instruments |
116 |
SNJ54BCT8245AFK |
Scan Test Devices With Octal Bus Transceivers |
Texas Instruments |
117 |
SNJ54BCT8245AJT |
Scan Test Devices With Octal Bus Transceivers |
Texas Instruments |
118 |
SST824 |
High Speed N-Channel Lateral DMOS JFET Switch(SMT) |
Linear Systems |
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