No. |
Part Name |
Description |
Manufacturer |
961 |
SN74LVTH18502A-EP |
Enhanced Product 3.3-V Abt Scan Test Devices With 18-Bit Universal Bus Transceivers |
Texas Instruments |
962 |
SN74LVTH18502APM |
3.3-V ABT Scan Test Devices With 18-Bit Universal Bus Transceivers |
Texas Instruments |
963 |
SN74LVTH18502APMG4 |
3.3-V ABT Scan Test Devices With 18-Bit Universal Bus Transceivers 64-LQFP -40 to 85 |
Texas Instruments |
964 |
SN74LVTH18502APMR |
3.3-V ABT Scan Test Devices With 18-Bit Universal Bus Transceivers |
Texas Instruments |
965 |
SN74LVTH18504A |
3.3-V ABT Scan Test Devices With 20-Bit Universal Bus Transceivers |
Texas Instruments |
966 |
SN74LVTH18504APM |
3.3-V ABT Scan Test Devices With 20-Bit Universal Bus Transceivers |
Texas Instruments |
967 |
SN74LVTH18504APMG4 |
3.3-V ABT Scan Test Devices With 20-Bit Universal Bus Transceivers 64-LQFP -40 to 85 |
Texas Instruments |
968 |
SN74LVTH18504APMR |
3.3-V ABT Scan Test Devices With 20-Bit Universal Bus Transceivers |
Texas Instruments |
969 |
SN74LVTH18511 |
3.3-V ABT 18-BIT UNIVERSAL BUS TRANSCEIVER WITH BOUNDARY SCAN |
Texas Instruments |
970 |
SN74LVTH18511DGGR |
3.3-V ABT 18-BIT UNIVERSAL BUS TRANSCEIVER WITH BOUNDARY SCAN |
Texas Instruments |
971 |
SN74LVTH18512 |
3.3-V ABT Scan Test Devices With 18-Bit Universal Bus Transceivers |
Texas Instruments |
972 |
SN74LVTH18512DGGR |
3.3-V ABT Scan Test Devices With 18-Bit Universal Bus Transceivers |
Texas Instruments |
973 |
SN74LVTH18514 |
3.3-V ABT Scan Test Devices With 20-Bit Universal Bus Transceivers |
Texas Instruments |
974 |
SN74LVTH18514DGGR |
3.3-V ABT Scan Test Devices With 20-Bit Universal Bus Transceivers |
Texas Instruments |
975 |
SN74LVTH18646A |
3.3-V ABT Scan Test Devices With 18-Bit Transceivers And Registers |
Texas Instruments |
976 |
SN74LVTH18646A-EP |
Enhanced Product 3.3-V Abt Scan Test Devices With 18-Bit Transceivers And Registers |
Texas Instruments |
977 |
SN74LVTH18646APM |
3.3-V ABT Scan Test Devices With 18-Bit Transceivers And Registers |
Texas Instruments |
978 |
SN74LVTH18646APMG4 |
3.3-V ABT Scan Test Devices With 18-Bit Transceivers And Registers 64-LQFP -40 to 85 |
Texas Instruments |
979 |
SN74LVTH18652A |
3.3-V ABT Scan Test Devices With 18-Bit Transceivers And Registers |
Texas Instruments |
980 |
SN74LVTH18652APM |
3.3-V ABT Scan Test Devices With 18-Bit Transceivers And Registers |
Texas Instruments |
981 |
SNJ54ABTH16244WD |
16-Bit Buffers/Drivers With 3-State Outputs |
Texas Instruments |
982 |
SNJ54ABTH16245WD |
16-BIT BUS TRANSCEIVERS WITH 3-STATE OUTPUTS |
Texas Instruments |
983 |
SNJ54ABTH18502AHV |
Scan Test Devices With 18-Bit Universal Bus Transceivers |
Texas Instruments |
984 |
SNJ54ABTH18646AHV |
Scan Test Devices With 18-Bit Transceivers And Registers |
Texas Instruments |
985 |
SNJ54ALVTH162245WD |
2.5-V/3.3-V 16-BIT BUS TRANSCEIVERS WITH 3-STATE OUTPUTS |
Texas Instruments |
986 |
SNJ54ALVTH16245WD |
2.5-V/3.3-V 16-BIT BUS TRANSCEIVERS WITH 3-STATE OUTPUTS |
Texas Instruments |
987 |
SNJ54LVTH162244WD |
3.3.-V ABT 16-Bit Buffers/Drivers With 3-State Outputs |
Texas Instruments |
988 |
SNJ54LVTH162245WD |
3.3-V ABT 16-Bit Bus Transceivers With 3-State Outputs |
Texas Instruments |
989 |
SNJ54LVTH162373WD |
3.3-V ABT 16-Bit Transparent D-type Latches With 3-State Outputs |
Texas Instruments |
990 |
SNJ54LVTH162374WD |
3.3-V ABT 16-Bit Edge-Triggered D-type Flip-Flops With 3-State Outputs |
Texas Instruments |
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