| No. |
Part Name |
Description |
Manufacturer |
| 1 |
AD53032 |
DRIVER/COMPARATOR/LOAD: A Single Chip that Performs the Pin Electronics Functions of Driver, Comparator and Active Load in ATE VLSI and Memory Testers |
Analog Devices |
| 2 |
DS21372 |
3.3V Bit Error Rate Tester (BERT) |
MAXIM - Dallas Semiconductor |
| 3 |
DS21372T |
3.3V Bit Error Rate Tester (BERT) |
Dallas Semiconductor |
| 4 |
DS21372T |
3.3V Bit Error Rate Tester BERT |
MAXIM - Dallas Semiconductor |
| 5 |
DS21372T+ |
3.3V Bit Error Rate Tester (BERT) |
MAXIM - Dallas Semiconductor |
| 6 |
DS21372TN |
3.3V Bit Error Rate Tester (BERT) |
Dallas Semiconductor |
| 7 |
DS21372TN |
3.3V Bit Error Rate Tester BERT |
MAXIM - Dallas Semiconductor |
| 8 |
DS21372TN+ |
3.3V Bit Error Rate Tester (BERT) |
MAXIM - Dallas Semiconductor |
| 9 |
DS2172 |
Bit Error Rate Tester (BERT) |
MAXIM - Dallas Semiconductor |
| 10 |
DS2172T |
Bit Error Rate Tester (BERT) |
Dallas Semiconductor |
| 11 |
DS2172T |
Bit Error Rate Tester BERT |
MAXIM - Dallas Semiconductor |
| 12 |
DS2172T+ |
Bit Error Rate Tester (BERT) |
MAXIM - Dallas Semiconductor |
| 13 |
DS2172T+T&R |
Bit Error Rate Tester (BERT) |
MAXIM - Dallas Semiconductor |
| 14 |
DS2172T/T&R |
Bit Error Rate Tester (BERT) |
MAXIM - Dallas Semiconductor |
| 15 |
DS2172TN |
Bit Error Rate Tester (BERT) |
Dallas Semiconductor |
| 16 |
DS2172TN |
Bit Error Rate Tester BERT |
MAXIM - Dallas Semiconductor |
| 17 |
DS2172TN+ |
Bit Error Rate Tester (BERT) |
MAXIM - Dallas Semiconductor |
| 18 |
DS2174DK |
Enhanced Bit Error-Rate Tester Design Kit |
MAXIM - Dallas Semiconductor |
| 19 |
DS26F32ME/883 |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
| 20 |
DS26F32MER-QML |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
| 21 |
DS26F32MJ-QMLV |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
| 22 |
DS26F32MJR-QML |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
| 23 |
DS26F32MJRQMLV |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
| 24 |
DS26F32MW-QMLV |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
| 25 |
DS26F32MWG/883 |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
| 26 |
DS26F32MWGRQMLV |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
| 27 |
DS26F32MWR-QML |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
| 28 |
DS26F32MWRQMLV |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
| 29 |
HLMP-ED80-K0T00 |
HLMP-ED80-K0T00 · Radiometrically Tested AlInGaP II Led Lamps for Sensor-Based Applications |
Agilent (Hewlett-Packard) |
| 30 |
IMC-1210-100 |
Molded, Wirewound Inductor. Tested at 100KHz |
Vishay |
| | | |
