| No. |
Part Name |
Description |
Manufacturer |
| 61 |
MNDS26F32MWG/883 |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
| 62 |
MNDS26F32MWGRQMLV |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
| 63 |
MNDS26F32MWR-QML |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
| 64 |
MNDS26F32MWRQMLV |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
| 65 |
MNLM136A |
2.5V REFERENCE DIODE, GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5 |
National Semiconductor |
| 66 |
MNLM136A-2.5-X |
2.5V REFERENCE DIODE, GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5 |
National Semiconductor |
| 67 |
MNLM136A-2.5-X-RH |
2.5V REFERENCE DIODE, GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5 |
National Semiconductor |
| 68 |
MNLMH6628-X-RH |
DUAL WIDEBAND, LOW-NOISE, VOLTAGE FEEDBACK OP AMP, GUARANTEED TO 300k rd (si) TESTED TO MIL-STD-883, METHOD 1019 |
National Semiconductor |
| 69 |
MODEL 1300 |
Gage Installation Tester |
Vishay |
| 70 |
MRLM111 |
Total supply voltage: 36V; negative V.: -30V; positiveV: +30V; voltage comparator: also available guaranteed to 30k rd (Si) tested to MIL-STD-883, method 1019 |
National Semiconductor |
| 71 |
N4906A |
Serial BERT 3.6 Gbps Bit Error Ratio Tester |
Agilent (Hewlett-Packard) |
| 72 |
TMC12451 |
Self-Calibrating 12-Bit Plus Sign, 7.7µs, µP-Compatible Sampling A/D Converter, Converter Tested and Specified for DSP Applications |
TRW |
| 73 |
YBT1 |
Backhaul T1 Tester |
Tektronix |
| | | |
