| No. |
Part Name |
Description |
Manufacturer |
| 11131 |
SN54ABTH18504A |
SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS |
Texas Instruments |
| 11132 |
SN54ABTH18504AHV |
SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS |
Texas Instruments |
| 11133 |
SN54ABTH18646A |
Scan Test Devices With 18-Bit Transceivers And Registers |
Texas Instruments |
| 11134 |
SN54ABTH18646AHV |
SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS |
Texas Instruments |
| 11135 |
SN54ABTH18652A |
SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS |
Texas Instruments |
| 11136 |
SN54ABTH18652AHV |
SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS |
Texas Instruments |
| 11137 |
SN54ACT8997 |
Scan Path Linkers With 4-Bit Identification Buses |
Texas Instruments |
| 11138 |
SN54ACT8997FK |
SCAN-PATH LINKERS WITH 4-BIT IDENTIFICATION BUSES SCAN-CONTROLLED IEEE STD 1149.1 JTAG TAP CONCATENATORS |
Texas Instruments |
| 11139 |
SN54ACT8997JT |
SCAN-PATH LINKERS WITH 4-BIT IDENTIFICATION BUSES SCAN-CONTROLLED IEEE STD 1149.1 JTAG TAP CONCATENATORS |
Texas Instruments |
| 11140 |
SN54BCT8240A |
Scan Test Devices With Octal Buffers |
Texas Instruments |
| 11141 |
SN54BCT8240AFK |
SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS |
Texas Instruments |
| 11142 |
SN54BCT8240AJT |
SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS |
Texas Instruments |
| 11143 |
SN54BCT8244A |
Scan Test Devices With Octal Buffers |
Texas Instruments |
| 11144 |
SN54BCT8244AFK |
SCAN TEST DEVICES WITH OCTAL BUFFERS |
Texas Instruments |
| 11145 |
SN54BCT8244AJT |
SCAN TEST DEVICES WITH OCTAL BUFFERS |
Texas Instruments |
| 11146 |
SN54BCT8245A |
Scan Test Devices With Octal Bus Transceivers |
Texas Instruments |
| 11147 |
SN54BCT8245AJT |
SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS |
Texas Instruments |
| 11148 |
SN54BCT8245ANT |
SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS |
Texas Instruments |
| 11149 |
SN54BCT8373A |
Scan Test Devices With Octal D-type Latches |
Texas Instruments |
| 11150 |
SN54BCT8373AFK |
SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES |
Texas Instruments |
| 11151 |
SN54BCT8373AJT |
SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES |
Texas Instruments |
| 11152 |
SN54BCT8374A |
Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops |
Texas Instruments |
| 11153 |
SN54BCT8374AFK |
SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS |
Texas Instruments |
| 11154 |
SN54BCT8374AJT |
SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS |
Texas Instruments |
| 11155 |
SN54LS13 |
SCHMITT TRIGGERS DUAL GATE/HEX INVERTER |
Motorola |
| 11156 |
SN54LS13J |
SCHMITT TRIGGERS DUAL GATE/HEX INVERTER |
Motorola |
| 11157 |
SN54LS13J |
SCHMITT TRIGGERS DUAL GATE/HEX INVERTER |
ON Semiconductor |
| 11158 |
SN54LS14 |
Schmitt Triggers Hex Inverters |
Motorola |
| 11159 |
SN54LS14J |
SCHMITT TRIGGERS DUAL GATE/HEX INVERTER |
Motorola |
| 11160 |
SN54LS14J |
SCHMITT TRIGGERS DUAL GATE/HEX INVERTER |
ON Semiconductor |
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