| No. |
Part Name |
Description |
Manufacturer |
| 11221 |
SN74ABTH18504APMR |
Scan Test Devices With 20-Bit Universal Bus Transceivers |
Texas Instruments |
| 11222 |
SN74ABTH18646A |
Scan Test Devices With 18-Bit Transceivers And Registers |
Texas Instruments |
| 11223 |
SN74ABTH18646APM |
Scan Test Devices With 18-Bit Transceivers And Registers |
Texas Instruments |
| 11224 |
SN74ABTH18652A |
Scan Test Devices With 18-Bit Transceivers And Registers |
Texas Instruments |
| 11225 |
SN74ABTH18652APM |
Scan Test Devices With 18-Bit Transceivers And Registers |
Texas Instruments |
| 11226 |
SN74ACT8997 |
Scan Path Linkers With 4-Bit Identification Buses Scan-Controlled TAP Concatenators |
Texas Instruments |
| 11227 |
SN74ACT8997DW |
Scan Path Linkers With 4-Bit Identification Buses Scan-Controlled TAP Concatenators |
Texas Instruments |
| 11228 |
SN74ACT8997DWR |
Scan Path Linkers With 4-Bit Identification Buses Scan-Controlled TAP Concatenators |
Texas Instruments |
| 11229 |
SN74ACT8997NT |
Scan Path Linkers With 4-Bit Identification Buses Scan-Controlled TAP Concatenators |
Texas Instruments |
| 11230 |
SN74ACT8999 |
Scan Path Selectors With 8-Bit Bidirectional Data Buses Scan-Controlled TAP Multiplexers 28-PDIP -40 to 85 |
Texas Instruments |
| 11231 |
SN74ACT8999DW |
Scan Path Selectors With 8-Bit Bidirectional Data Buses Scan-Controlled TAP Multiplexers 28-SOIC -40 to 85 |
Texas Instruments |
| 11232 |
SN74ACT8999NT |
Scan Path Selectors With 8-Bit Bidirectional Data Buses Scan-Controlled TAP Multiplexers 28-PDIP -40 to 85 |
Texas Instruments |
| 11233 |
SN74BCT8245AFK |
SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS |
Texas Instruments |
| 11234 |
SN74BCT8373 |
Scan Test Device With Octal D-Type Latches 24-PDIP 0 to 70 |
Texas Instruments |
| 11235 |
SN74BCT8373DW |
Scan Test Device With Octal D-Type Latches 24-SOIC 0 to 70 |
Texas Instruments |
| 11236 |
SN74BCT8373DWR |
Scan Test Device With Octal D-Type Latches 24-SOIC 0 to 70 |
Texas Instruments |
| 11237 |
SN74BCT8373NT |
Scan Test Device With Octal D-Type Latches 24-PDIP 0 to 70 |
Texas Instruments |
| 11238 |
SN74BCT8374A |
Scan Test Device With Octal D-Type Edge-Triggered Flip-Flops |
Texas Instruments |
| 11239 |
SN74BCT8374ADW |
Scan Test Device With Octal D-Type Edge-Triggered Flip-Flops |
Texas Instruments |
| 11240 |
SN74BCT8374ADWR |
Scan Test Device With Octal D-Type Edge-Triggered Flip-Flops |
Texas Instruments |
| 11241 |
SN74BCT8374ANT |
Scan Test Device With Octal D-Type Edge-Triggered Flip-Flops |
Texas Instruments |
| 11242 |
SN74LS13 |
SCHMITT TRIGGERS DUAL GATE/HEX INVERTER |
Motorola |
| 11243 |
SN74LS13D |
SCHMITT TRIGGERS DUAL GATE/HEX INVERTER |
Motorola |
| 11244 |
SN74LS13D |
SCHMITT TRIGGERS DUAL GATE/HEX INVERTER |
ON Semiconductor |
| 11245 |
SN74LS13N |
SCHMITT TRIGGERS DUAL GATE/HEX INVERTER |
Motorola |
| 11246 |
SN74LS13N |
SCHMITT TRIGGERS DUAL GATE/HEX INVERTER |
ON Semiconductor |
| 11247 |
SN74LS14 |
Schmitt Triggers Hex Inverters |
Motorola |
| 11248 |
SN74LS14-D |
Schmitt Triggers Dual Gate/Hex Inverter |
ON Semiconductor |
| 11249 |
SN74LS14D |
SCHMITT TRIGGERS DUAL GATE/HEX INVERTER |
Motorola |
| 11250 |
SN74LS14D |
SCHMITT TRIGGERS DUAL GATE/HEX INVERTER |
ON Semiconductor |
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