No. |
Part Name |
Description |
Manufacturer |
121 |
SCAN921226HSM |
High Temperature 20MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 125 |
Texas Instruments |
122 |
SCAN921226HSM/NOPB |
High Temperature 20MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 125 |
Texas Instruments |
123 |
SCAN921226HSMX |
High Temperature 20MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access |
National Semiconductor |
124 |
SCAN921226SLC |
30MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access |
National Semiconductor |
125 |
SCAN921226SLC/NOPB |
30-80 MHz 10 Bit Bus LVDS Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST 49-NFBGA |
Texas Instruments |
126 |
SCAN921226SLCX |
30MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access |
National Semiconductor |
127 |
SCAN921260 |
X6 1:10 Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST |
National Semiconductor |
128 |
SCAN921260 |
six 1 to 10 deserializers with IEEE 1149.1 and at-speed BIST |
Texas Instruments |
129 |
SCAN921260UJB |
six 1 to 10 deserializers with IEEE 1149.1 and at-speed BIST |
National Semiconductor |
130 |
SCAN921260UJB/NOPB |
six 1 to 10 deserializers with IEEE 1149.1 and at-speed BIST 196-NFBGA -40 to 85 |
Texas Instruments |
131 |
SCAN921260UJBX |
six 1 to 10 deserializers with IEEE 1149.1 and at-speed BIST |
National Semiconductor |
132 |
SCAN921821 |
Dual 18-Bit Serializer with Pre-Emphasis, IEEE 1149.1 (JTAG), and At-Speed BIST |
National Semiconductor |
133 |
SCAN921821 |
Dual 18-Bit Serializer with Pre-Emphasis, IEEE 1149.1 (JTAG), and At-Speed BIST |
Texas Instruments |
134 |
SCAN921821EVK |
Dual 18-Bit Serializer with Pre-Emphasis, IEEE 1149.1 (JTAG), and At-Speed BIST |
National Semiconductor |
135 |
SCAN921821SM |
3.3 V, dual 18-bit serializer with pre-emphasis, IEEE 1149.1 (JTAG) and at-speed BIST |
National Semiconductor |
136 |
SCAN921821TSM |
Dual 18-Bit Serializer with Pre-Emphasis, IEEE 1149.1 (JTAG), and At-Speed BIST |
National Semiconductor |
137 |
SCAN921821TSM/NOPB |
Dual 18-Bit Serializer with Pre-Emphasis, IEEE 1149.1 (JTAG), and At-Speed BIST 100-NFBGA -40 to 85 |
Texas Instruments |
138 |
SCAN926260 |
Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST |
National Semiconductor |
139 |
SCAN926260 |
Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST |
Texas Instruments |
140 |
SCAN926260TUF |
Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST |
National Semiconductor |
141 |
SCAN926260TUF |
Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST 196-NFBGA -40 to 85 |
Texas Instruments |
142 |
SCAN926260TUF/NOPB |
Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST 196-NFBGA -40 to 85 |
Texas Instruments |
143 |
SCAN926260TUFX |
3.0 V to 3.6 V, six 1 to 10 bus LVDS deserializer with IEEE 1149.1 and at-speed BIST |
National Semiconductor |
144 |
SCAN926260TUFX |
Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST 196-NFBGA -40 to 85 |
Texas Instruments |
145 |
SCAN926260TUFX/NOPB |
Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST 196-NFBGA -40 to 85 |
Texas Instruments |
146 |
SCAN928028 |
8 Channel 10:1 Serializer with IEEE 1149.1 and At-Speed BIST |
National Semiconductor |
147 |
SCAN928028 |
8 Channel 10:1 Serializer with IEEE 1149.1 and At-Speed BIST |
Texas Instruments |
148 |
SCAN928028TUF |
8 Channel 10:1 Serializer with IEEE 1149.1 and At-Speed BIST |
National Semiconductor |
149 |
SCAN928028TUF |
8 Channel 10:1 Serializer with IEEE 1149.1 and At-Speed BIST 196-NFBGA -40 to 85 |
Texas Instruments |
150 |
SCAN928028TUF/NOPB |
8 Channel 10:1 Serializer with IEEE 1149.1 and At-Speed BIST 196-NFBGA -40 to 85 |
Texas Instruments |
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