No. |
Part Name |
Description |
Manufacturer |
211 |
SN54ABT8996 |
10-Bit Addressable Scan Ports Multidrop-Addressable IEEE 1149.1 |
Texas Instruments |
212 |
SN54ABT8996FK |
10-Bit Addressable Scan Ports Multidrop-Addressable IEEE 1149.1 |
Texas Instruments |
213 |
SN54ABT8996JT |
10-Bit Addressable Scan Ports Multidrop-Addressable IEEE 1149.1 |
Texas Instruments |
214 |
SN54ABT8996W |
10-Bit Addressable Scan Ports Multidrop-Addressable IEEE 1149.1 24-CFP |
Texas Instruments |
215 |
SN54ACT8990GB |
TEST-BUS CONTROLLERS IEEE STD 1149.1 JTAG TAP MASTERS WITH 16-BIT GENERIC HOST INTERFACES |
Texas Instruments |
216 |
SN54ACT8990HV |
TEST-BUS CONTROLLERS IEEE STD 1149.1 JTAG TAP MASTERS WITH 16-BIT GENERIC HOST INTERFACES |
Texas Instruments |
217 |
SN54ACT8997FK |
SCAN-PATH LINKERS WITH 4-BIT IDENTIFICATION BUSES SCAN-CONTROLLED IEEE STD 1149.1 JTAG TAP CONCATENATORS |
Texas Instruments |
218 |
SN54ACT8997JT |
SCAN-PATH LINKERS WITH 4-BIT IDENTIFICATION BUSES SCAN-CONTROLLED IEEE STD 1149.1 JTAG TAP CONCATENATORS |
Texas Instruments |
219 |
SN54LVT8980 |
EMBEDDED TEST-BUS CONTROLLERS IEEE STD 1149.1 JTAG TAP MASTERS WITH 8-BIT GENERIC HOST INTERFACES |
Texas Instruments |
220 |
SN54LVT8980A |
Embedded Test-Bus Controllers IEEE STD 1149.1 (Jtag) Tap Masters W/ 8-Bit Gener |
Texas Instruments |
221 |
SN54LVT8980JT |
EMBEDDED TEST-BUS CONTROLLERS IEEE STD 1149.1 JTAG TAP MASTERS WITH 8-BIT GENERIC HOST INTERFACES |
Texas Instruments |
222 |
SN54LVT8986 |
3.3-V Linking Addressable Scan Ports Multidrop-Addressable IEEE STD 1149.1 (JTAG) Tap Transceiver |
Texas Instruments |
223 |
SN54LVT8996 |
3.3-V 10-BIT ADDRESSABLE SCAN PORTS MULTIDROP-ADDRESSABLE IEEE STD 1149.1 JTAG TAP TRANSCEIVERS |
Texas Instruments |
224 |
SN54LVT8996FK |
3.3-V 10-BIT ADDRESSABLE SCAN PORTS MULTIDROP-ADDRESSABLE IEEE STD 1149.1 JTAG TAP TRANSCEIVERS |
Texas Instruments |
225 |
SN54LVT8996JT |
3.3-V 10-BIT ADDRESSABLE SCAN PORTS MULTIDROP-ADDRESSABLE IEEE STD 1149.1 JTAG TAP TRANSCEIVERS |
Texas Instruments |
226 |
SN74ACT8990 |
Test-Bus Controllers IEEE Std 1149.1 (JTAG) TAP Masters With 16-Bit Generic Host Interfaces |
Texas Instruments |
227 |
SN74ACT8990FN |
Test-Bus Controllers IEEE Std 1149.1 (JTAG) TAP Masters With 16-Bit Generic Host Interfaces |
Texas Instruments |
228 |
SN74ACT8990FNR |
Test-Bus Controllers IEEE Std 1149.1 (JTAG) TAP Masters With 16-Bit Generic Host Interfaces |
Texas Instruments |
229 |
SN74ACT8994 |
DIGITAL BUS MONITOR IEEE STD 1149.1 JTAG SCAN-CONTROLLED LOGIC/SIGNATURE ANALYZER |
Texas Instruments |
230 |
SN74ACT8994FN |
DIGITAL BUS MONITOR IEEE STD 1149.1 JTAG SCAN-CONTROLLED LOGIC/SIGNATURE ANALYZER |
Texas Instruments |
231 |
SN74BCT8240A |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Inverting Buffers |
Texas Instruments |
232 |
SN74BCT8240ADW |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Inverting Buffers |
Texas Instruments |
233 |
SN74BCT8240ADWR |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Inverting Buffers |
Texas Instruments |
234 |
SN74BCT8240ANT |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Inverting Buffers |
Texas Instruments |
235 |
SN74BCT8244A |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers |
Texas Instruments |
236 |
SN74BCT8244ADW |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers |
Texas Instruments |
237 |
SN74BCT8244ADWE4 |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers 24-SOIC 0 to 70 |
Texas Instruments |
238 |
SN74BCT8244ADWR |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers |
Texas Instruments |
239 |
SN74BCT8244ANT |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers |
Texas Instruments |
240 |
SN74BCT8245A |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Bus Transceivers |
Texas Instruments |
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