No. |
Part Name |
Description |
Manufacturer |
121 |
LTI210UFTD |
1000 V doubler 10-12.5 A forward current, 70 ns recovery time |
Voltage Multipliers |
122 |
LTI210UFTP |
1000 V positive center tap 20-25 A forward current, 70 ns recovery time |
Voltage Multipliers |
123 |
LTI602UF |
200 V three phase bridge 30-40 A forward current, 70 ns recovery time |
Voltage Multipliers |
124 |
LTI602UFT |
200 V three phase bridge 30-40 A forward current, 70 ns recovery time |
Voltage Multipliers |
125 |
LTI606UF |
600 V three phase bridge 30-40 A forward current, 70 ns recovery time |
Voltage Multipliers |
126 |
LTI606UFT |
600 V three phase bridge 30-40 A forward current, 70 ns recovery time |
Voltage Multipliers |
127 |
LTI610UF |
1000 V three phase bridge 30-40 A forward current, 70 ns recovery time |
Voltage Multipliers |
128 |
LTI610UFT |
1000 V three phase bridge 30-40 A forward current, 70 ns recovery time |
Voltage Multipliers |
129 |
MH25632BJ-7 |
Access time: 70 ns, 265K x 4 bit dynamic RAM |
Mitsubishi Electric Corporation |
130 |
N28F001BN-B70 |
1-Mbit(128K x 8) boot block flash memory. Access speed 70 ns |
Intel |
131 |
N28F001BN-T70 |
1-Mbit(128K x 8) boot block flash memory. Access speed 70 ns |
Intel |
132 |
N28F020-70 |
2048(256 x 8) CMOS flash memory. Access speed 70 ns |
Intel |
133 |
NMC27C010Q17 |
170 ns, Vcc=5V+/-5%, 1,048,576-bit (128k x 8) UV erasable CMOS PROM |
National Semiconductor |
134 |
NMC27C010Q170 |
170 ns, Vcc=5V+/-10%, 1,048,576-bit (128k x 8) UV erasable CMOS PROM |
National Semiconductor |
135 |
NMC27C010QE170 |
170 ns, Vcc=5V+/-10%, 1,048,576-bit (128k x 8) UV erasable CMOS PROM |
National Semiconductor |
136 |
NMC27C010QM170 |
170 ns, Vcc=5V+/-10%, 1,048,576-bit (128k x 8) UV erasable CMOS PROM |
National Semiconductor |
137 |
NMC27C1024Q17 |
170 ns, Vcc=5V+/-5%, 1,048,576-bit (64k x 8) UV erasable CMOS PROM |
National Semiconductor |
138 |
NMC27C1024Q170 |
170 ns, Vcc=5V+/-10%, 1,048,576-bit (64k x 8) UV erasable CMOS PROM |
National Semiconductor |
139 |
NMC27C1024QE170 |
170 ns, Vcc=5V+/-10%, 1,048,576-bit (64k x 8) UV erasable CMOS PROM |
National Semiconductor |
140 |
NMC27C1024QM170 |
170 ns, Vcc=5V+/-10%, 1,048,576-bit (64k x 8) UV erasable CMOS PROM |
National Semiconductor |
141 |
NMC27C256Q17 |
170 ns, Vcc=5V+/-5%, 262,144-bit (32k x 8) UV erasable CMOS PROM |
National Semiconductor |
142 |
NMC27C512AN17 |
170 ns, Vcc=5V+/-5%, 524,288-bit (64k x 8) one time programmable CMOS PROM |
National Semiconductor |
143 |
NMC27C512AN170 |
170 ns, Vcc=5V+/-10%, 524,288-bit (64k x 8) one time programmable CMOS PROM |
National Semiconductor |
144 |
NMC27C512ANE17 |
170 ns, Vcc=5V+/-5%, 524,288-bit (64k x 8) one time programmable CMOS PROM |
National Semiconductor |
145 |
NMC27C512ANE170 |
170 ns, Vcc=5V+/-10%, 524,288-bit (64k x 8) one time programmable CMOS PROM |
National Semiconductor |
146 |
NMC27C512AQ17 |
170 ns, Vcc=5V+/-5%, 524,288-bit (64k x 8) UV erasable CMOS PROM |
National Semiconductor |
147 |
NMC27C512AQ170 |
170 ns, Vcc=5V+/-10%, 524,288-bit (64k x 8) UV erasable CMOS PROM |
National Semiconductor |
148 |
NMC27C512AQE170 |
170 ns, Vcc=5V+/-10%, 524,288-bit (64k x 8) UV erasable CMOS PROM |
National Semiconductor |
149 |
NMC27C512AQM170 |
170 ns, Vcc=5V+/-10%, 524,288-bit (64k x 8) UV erasable CMOS PROM |
National Semiconductor |
150 |
NX29F010-70PL |
70 ns, 5 V, 1M-bit CMOS ultra-fast sectored flash memory |
NexFlash |
| | | |