No. |
Part Name |
Description |
Manufacturer |
121 |
LAN9252TI/ML |
EtherCAT |
Microchip |
122 |
LAN9252TI/PT |
EtherCAT |
Microchip |
123 |
LAN9252TV/ML |
EtherCAT |
Microchip |
124 |
LAN9252V/ML |
EtherCAT |
Microchip |
125 |
NCN9252 |
DP3T Data Switch, USB 2.0 High Speed (480 Mbps), USB/UART/Data Multiplexing |
ON Semiconductor |
126 |
PN929 |
NPN Silicon Planar Transistor for low-level audio applications |
Newmarket Transistors NKT |
127 |
SCAN921023 |
20-66 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST |
National Semiconductor |
128 |
SCAN921023 |
20 MHz-66MHz 10-Bit Serializer with IEEE 1149.1 Test Access |
Texas Instruments |
129 |
SCAN921023SLC |
20 MHz-66MHz 10-Bit Serializer with IEEE 1149.1 Test Access |
National Semiconductor |
130 |
SCAN921023SLC |
20 MHz-66MHz 10-Bit Serializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 85 |
Texas Instruments |
131 |
SCAN921023SLC/NOPB |
20 MHz-66MHz 10-Bit Serializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 85 |
Texas Instruments |
132 |
SCAN921023SLCX |
20 MHz-66MHz 10-Bit Serializer with IEEE 1149.1 Test Access |
National Semiconductor |
133 |
SCAN921025 |
30-80 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST |
National Semiconductor |
134 |
SCAN921025 |
30-80 MHz 10 Bit Bus LVDS Serializer with IEEE 1149.1 (JTAG) and at-speed BIST 49-NFBGA |
Texas Instruments |
135 |
SCAN921025H |
High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access |
National Semiconductor |
136 |
SCAN921025H |
High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access |
Texas Instruments |
137 |
SCAN921025HSM |
High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access |
National Semiconductor |
138 |
SCAN921025HSM |
High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 125 |
Texas Instruments |
139 |
SCAN921025HSM/NOPB |
High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 125 |
Texas Instruments |
140 |
SCAN921025HSMX |
High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access |
National Semiconductor |
141 |
SCAN921025HSMX/NOPB |
High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 125 |
Texas Instruments |
142 |
SCAN921025SLC |
30MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access |
National Semiconductor |
143 |
SCAN921025SLC/NOPB |
30-80 MHz 10 Bit Bus LVDS Serializer with IEEE 1149.1 (JTAG) and at-speed BIST 49-NFBGA |
Texas Instruments |
144 |
SCAN921025SLCX |
30MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access |
National Semiconductor |
145 |
SCAN921224 |
20-66 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST |
National Semiconductor |
146 |
SCAN921224 |
20 MHz-66MHz 10-Bit Deserializer with IEEE 1149.1 Test Access |
Texas Instruments |
147 |
SCAN921224SLC |
20 MHz-66MHz 10-Bit Deserializer with IEEE 1149.1 Test Access |
National Semiconductor |
148 |
SCAN921224SLC |
20 MHz-66MHz 10-Bit Deserializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 85 |
Texas Instruments |
149 |
SCAN921224SLC/NOPB |
20 MHz-66MHz 10-Bit Deserializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 85 |
Texas Instruments |
150 |
SCAN921224SLCX |
20 MHz-66MHz 10-Bit Deserializer with IEEE 1149.1 Test Access |
National Semiconductor |
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