No. |
Part Name |
Description |
Manufacturer |
151 |
SCAN921226 |
30-80 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST |
National Semiconductor |
152 |
SCAN921226 |
30-80 MHz 10 Bit Bus LVDS Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST 49-NFBGA |
Texas Instruments |
153 |
SCAN921226H |
High Temperature 20MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access |
National Semiconductor |
154 |
SCAN921226H |
High Temperature 20MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access |
Texas Instruments |
155 |
SCAN921226HSM |
High Temperature 20MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access |
National Semiconductor |
156 |
SCAN921226HSM |
High Temperature 20MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 125 |
Texas Instruments |
157 |
SCAN921226HSM/NOPB |
High Temperature 20MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 125 |
Texas Instruments |
158 |
SCAN921226HSMX |
High Temperature 20MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access |
National Semiconductor |
159 |
SCAN921226SLC |
30MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access |
National Semiconductor |
160 |
SCAN921226SLC/NOPB |
30-80 MHz 10 Bit Bus LVDS Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST 49-NFBGA |
Texas Instruments |
161 |
SCAN921226SLCX |
30MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access |
National Semiconductor |
162 |
SCAN921260 |
X6 1:10 Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST |
National Semiconductor |
163 |
SCAN921260 |
six 1 to 10 deserializers with IEEE 1149.1 and at-speed BIST |
Texas Instruments |
164 |
SCAN921260UJB |
six 1 to 10 deserializers with IEEE 1149.1 and at-speed BIST |
National Semiconductor |
165 |
SCAN921260UJB/NOPB |
six 1 to 10 deserializers with IEEE 1149.1 and at-speed BIST 196-NFBGA -40 to 85 |
Texas Instruments |
166 |
SCAN921260UJBX |
six 1 to 10 deserializers with IEEE 1149.1 and at-speed BIST |
National Semiconductor |
167 |
SCAN921821 |
Dual 18-Bit Serializer with Pre-Emphasis, IEEE 1149.1 (JTAG), and At-Speed BIST |
National Semiconductor |
168 |
SCAN921821 |
Dual 18-Bit Serializer with Pre-Emphasis, IEEE 1149.1 (JTAG), and At-Speed BIST |
Texas Instruments |
169 |
SCAN921821EVK |
Dual 18-Bit Serializer with Pre-Emphasis, IEEE 1149.1 (JTAG), and At-Speed BIST |
National Semiconductor |
170 |
SCAN921821SM |
3.3 V, dual 18-bit serializer with pre-emphasis, IEEE 1149.1 (JTAG) and at-speed BIST |
National Semiconductor |
171 |
SCAN921821TSM |
Dual 18-Bit Serializer with Pre-Emphasis, IEEE 1149.1 (JTAG), and At-Speed BIST |
National Semiconductor |
172 |
SCAN921821TSM/NOPB |
Dual 18-Bit Serializer with Pre-Emphasis, IEEE 1149.1 (JTAG), and At-Speed BIST 100-NFBGA -40 to 85 |
Texas Instruments |
173 |
SCAN926260 |
Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST |
National Semiconductor |
174 |
SCAN926260 |
Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST |
Texas Instruments |
175 |
SCAN926260TUF |
Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST |
National Semiconductor |
176 |
SCAN926260TUF |
Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST 196-NFBGA -40 to 85 |
Texas Instruments |
177 |
SCAN926260TUF/NOPB |
Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST 196-NFBGA -40 to 85 |
Texas Instruments |
178 |
SCAN926260TUFX |
3.0 V to 3.6 V, six 1 to 10 bus LVDS deserializer with IEEE 1149.1 and at-speed BIST |
National Semiconductor |
179 |
SCAN926260TUFX |
Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST 196-NFBGA -40 to 85 |
Texas Instruments |
180 |
SCAN926260TUFX/NOPB |
Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST 196-NFBGA -40 to 85 |
Texas Instruments |
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