| No. |
Part Name |
Description |
Manufacturer |
| 1261 |
L9310 |
Line Interface and Line Access Circuit Full-Feature SLIC,Ringing Relay,and Test Access Device |
Agere Systems |
| 1262 |
L9311 |
Line Interface and Line Access Circuit Full-Feature SLIC with High Longitudinal Balance, Ringing Relay,and GR-909 Test Access |
Agere Systems |
| 1263 |
LTS-2010 |
Component Test Systems - Single Disk Drive |
Analog Devices |
| 1264 |
LTS-2012 |
Component Test Systems - Dual Disk Drive |
Analog Devices |
| 1265 |
LTS-2015 |
Component Test Systems - Dual Disk Drive and Numeerics Processor |
Analog Devices |
| 1266 |
LUCL9310AP |
Line interface and line acces circuit full-feature SLIC, ringing relay and test acces device. |
Agere Systems |
| 1267 |
LUCL9310AP-D |
Line Interface and Line Access Circuit Full-Feature SLIC,Ringing Relay,and Test Access Device |
Agere Systems |
| 1268 |
LUCL9310AP-DT |
Line Interface and Line Access Circuit Full-Feature SLIC,Ringing Relay,and Test Access Device |
Agere Systems |
| 1269 |
LUCL9310GP |
Line interface and line acces circuit full-feature SLIC, ringing relay and test acces device. |
Agere Systems |
| 1270 |
LUCL9310GP-D |
Line Interface and Line Access Circuit Full-Feature SLIC,Ringing Relay,and Test Access Device |
Agere Systems |
| 1271 |
LUCL9310GP-DT |
Line Interface and Line Access Circuit Full-Feature SLIC,Ringing Relay,and Test Access Device |
Agere Systems |
| 1272 |
LUCL9311AP |
Line interface and line acces circuit full-feature SLIC with high longitudinal balance, ringing relay and GR-909 test acces. |
Agere Systems |
| 1273 |
LUCL9311AP-D |
Line Interface and Line Access Circuit Full-Feature SLIC with High Longitudinal Balance, Ringing Relay,and GR-909 Test Access |
Agere Systems |
| 1274 |
LUCL9311AP-DT |
Line Interface and Line Access Circuit Full-Feature SLIC with High Longitudinal Balance, Ringing Relay,and GR-909 Test Access |
Agere Systems |
| 1275 |
LUCL9311GP |
Line interface and line acces circuit full-feature SLIC with high longitudinal balance, ringing relay and GR-909 test acces. |
Agere Systems |
| 1276 |
LUCL9311GP-D |
Line Interface and Line Access Circuit Full-Feature SLIC with High Longitudinal Balance, Ringing Relay,and GR-909 Test Access |
Agere Systems |
| 1277 |
LUCL9311GP0DT |
Line Interface and Line Access Circuit Full-Feature SLIC with High Longitudinal Balance, Ringing Relay,and GR-909 Test Access |
Agere Systems |
| 1278 |
MAX1036EKA-T |
2.7-5.5V; low power, 4-/12-channel 2-wire serial 8-bit ADC. For hand-held portable applications, medical instrumnets, battery-powered test equipment, solar-powered remote systems, received-signal-strength indicators, system supervision |
MAXIM - Dallas Semiconductor |
| 1279 |
MAX1037EKA-T |
2.7-5.5V; low power, 4-/12-channel 2-wire serial 8-bit ADC. For hand-held portable applications, medical instrumnets, battery-powered test equipment, solar-powered remote systems, received-signal-strength indicators, system supervision |
MAXIM - Dallas Semiconductor |
| 1280 |
MAX1069AEUD |
0.3-6V; 58.6ksps, 14-bit, 2-wire serial 8-bit serial ADC. For hand-held portable applications, medical instrumnets, battery-powered test equipment, solar-powered remote systems, received-signal-strength indicators, system supervision |
MAXIM - Dallas Semiconductor |
| 1281 |
MAX1069BEUD |
0.3-6V; 58.6ksps, 14-bit, 2-wire serial 8-bit serial ADC. For hand-held portable applications, medical instrumnets, battery-powered test equipment, solar-powered remote systems, received-signal-strength indicators, system supervision |
MAXIM - Dallas Semiconductor |
| 1282 |
MAX1069CEUD |
0.3-6V; 58.6ksps, 14-bit, 2-wire serial 8-bit serial ADC. For hand-held portable applications, medical instrumnets, battery-powered test equipment, solar-powered remote systems, received-signal-strength indicators, system supervision |
MAXIM - Dallas Semiconductor |
| 1283 |
MAX1267AEEI |
3V, 6-/2 channel, 12-bit ADC with +2.5V reference and parallel interface. For hand-held portable applications, medical instruments, battery-powered test equipment |
MAXIM - Dallas Semiconductor |
| 1284 |
MAX1267BEEI |
3V, 6-/2 channel, 12-bit ADC with +2.5V reference and parallel interface. For hand-held portable applications, medical instruments, battery-powered test equipment |
MAXIM - Dallas Semiconductor |
| 1285 |
MAX677ACJP |
889mW; V(cc): -0.3 to +20V; calibrated, low-drift, +4.096V / +5V / +10V precision voltage reference. For high resolution 16-bit ADCs and DACs, precision test and measurement systems, precision calibrated voltage-reference, high-accuracy tr |
MAXIM - Dallas Semiconductor |
| 1286 |
MAX677ACPP |
V(cc): -0.3 to +20V; calibrated, low-drift, +4.096V / +5V / +10V precision voltage reference. For high resolution 16-bit ADCs and DACs, precision test and measurement systems, precision calibrated voltage-reference, high-accuracy transduce |
MAXIM - Dallas Semiconductor |
| 1287 |
MAX677ACWP |
800mW; V(cc): -0.3 to +20V; calibrated, low-drift, +4.096V / +5V / +10V precision voltage reference. For high resolution 16-bit ADCs and DACs, precision test and measurement systems, precision calibrated voltage-reference, high-accuracy tr |
MAXIM - Dallas Semiconductor |
| 1288 |
MAX677AEJP |
889mW; V(cc): -0.3 to +20V; calibrated, low-drift, +4.096V / +5V / +10V precision voltage reference. For high resolution 16-bit ADCs and DACs, precision test and measurement systems, precision calibrated voltage-reference, high-accuracy tr |
MAXIM - Dallas Semiconductor |
| 1289 |
MAX677AEPP |
889mW; V(cc): -0.3 to +20V; calibrated, low-drift, +4.096V / +5V / +10V precision voltage reference. For high resolution 16-bit ADCs and DACs, precision test and measurement systems, precision calibrated voltage-reference, high-accuracy tr |
MAXIM - Dallas Semiconductor |
| 1290 |
MAX677AEWP |
800mW; V(cc): -0.3 to +20V; calibrated, low-drift, +4.096V / +5V / +10V precision voltage reference. For high resolution 16-bit ADCs and DACs, precision test and measurement systems, precision calibrated voltage-reference, high-accuracy tr |
MAXIM - Dallas Semiconductor |
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