| No. |
Part Name |
Description |
Manufacturer |
| 2311 |
SN74LVTH18514DGGR |
3.3-V ABT Scan Test Devices With 20-Bit Universal Bus Transceivers |
Texas Instruments |
| 2312 |
SN74LVTH18646A |
3.3-V ABT Scan Test Devices With 18-Bit Transceivers And Registers |
Texas Instruments |
| 2313 |
SN74LVTH18646A-EP |
Enhanced Product 3.3-V Abt Scan Test Devices With 18-Bit Transceivers And Registers |
Texas Instruments |
| 2314 |
SN74LVTH18646APM |
3.3-V ABT Scan Test Devices With 18-Bit Transceivers And Registers |
Texas Instruments |
| 2315 |
SN74LVTH18646APMG4 |
3.3-V ABT Scan Test Devices With 18-Bit Transceivers And Registers 64-LQFP -40 to 85 |
Texas Instruments |
| 2316 |
SN74LVTH18652A |
3.3-V ABT Scan Test Devices With 18-Bit Transceivers And Registers |
Texas Instruments |
| 2317 |
SN74LVTH18652APM |
3.3-V ABT Scan Test Devices With 18-Bit Transceivers And Registers |
Texas Instruments |
| 2318 |
SN74SSQE32882 |
JEDEC SSTE32882 Compliant 28-Bit to 56-Bit Registered Buffer with Address-Parity Test 176-NFBGA 0 to 85 |
Texas Instruments |
| 2319 |
SN74SSQE32882ZALR |
JEDEC SSTE32882 Compliant 28-Bit to 56-Bit Registered Buffer with Address-Parity Test 176-NFBGA 0 to 85 |
Texas Instruments |
| 2320 |
SN74SSQEA32882ZALR |
JEDEC SSTE32882 Compliant 28-Bit to 56-Bit Registered Buffer with Address-Parity Test 176-NFBGA 0 to 85 |
Texas Instruments |
| 2321 |
SN74SSQEB32882 |
JEDEC SSTE32882 Compliant 28-Bit to 56-Bit Registered Buffer with Address-Parity Test 176-NFBGA 0 to 85 |
Texas Instruments |
| 2322 |
SN74SSQEB32882ZALR |
JEDEC SSTE32882 Compliant 28-Bit to 56-Bit Registered Buffer with Address-Parity Test 176-NFBGA 0 to 85 |
Texas Instruments |
| 2323 |
SN74SSQEC32882ZALR |
JEDEC SSTE32882 Compliant Low Power 28-Bit to 56-Bit Registered Buffer with Address-Parity Test 176-NFBGA 0 to 85 |
Texas Instruments |
| 2324 |
SN74SSTEB32866 |
1.5V/1.8V 25-Bit Configurable Registered Buffer With Address-Parity Test 96-BGA -40 to 85 |
Texas Instruments |
| 2325 |
SN74SSTEB32866ZWLR |
1.5V/1.8V 25-Bit Configurable Registered Buffer With Address-Parity Test 96-BGA -40 to 85 |
Texas Instruments |
| 2326 |
SN74SSTUB32866ZKER |
25-Bit Configurable Registered Buffer With Address-Parity Test 96-LFBGA -40 to 85 |
Texas Instruments |
| 2327 |
SN74SSTUB32866ZWLR |
25-Bit Configurable Registered Buffer With Address-Parity Test 96-BGA -40 to 85 |
Texas Instruments |
| 2328 |
SNJ54ABT18245AWD |
Scan Test Devices With 18-Bit Bus Transceivers |
Texas Instruments |
| 2329 |
SNJ54ABT18245WD |
Scan Test Device With 18-Bit Bus Transceivers 56-CFP -55 to 125 |
Texas Instruments |
| 2330 |
SNJ54ABT18502HV |
Scan Test Device With 18-Bit Registered Bus Transceiver |
Texas Instruments |
| 2331 |
SNJ54ABT18646HV |
Scan Test Devices With 18-Bit Bus Transceivers And Registers |
Texas Instruments |
| 2332 |
SNJ54ABT8245FK |
Scan Test Devices With Octal Bus Transceivers |
Texas Instruments |
| 2333 |
SNJ54ABT8245JT |
Scan Test Devices With Octal Bus Transceivers |
Texas Instruments |
| 2334 |
SNJ54ABT8543FK |
Scan Test Devices With Octal Registered Bus Tranceivers |
Texas Instruments |
| 2335 |
SNJ54ABT8543JT |
Scan Test Devices With Octal Registered Bus Tranceivers |
Texas Instruments |
| 2336 |
SNJ54ABT8646FK |
Scan Test Devices With Octal Bus Transceivers And Registers |
Texas Instruments |
| 2337 |
SNJ54ABT8646JT |
Scan Test Devices With Octal Bus Transceivers And Registers |
Texas Instruments |
| 2338 |
SNJ54ABT8652FK |
Scan Test Devices With Octal Bus Transceivers And Registers |
Texas Instruments |
| 2339 |
SNJ54ABT8652JT |
Scan Test Devices With Octal Bus Transceivers And Registers |
Texas Instruments |
| 2340 |
SNJ54ABTH18502AHV |
Scan Test Devices With 18-Bit Universal Bus Transceivers |
Texas Instruments |
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